OFF-state current limits of narrow bandgap MOSFETs

被引:21
作者
Passlack, Matthias [1 ]
机构
[1] Freescale Semicond Inc, Tempe, AZ 85284 USA
关键词
high-mobility channels; minority carrier extraction; MOSFETs; narrow bandgap channels; off-state current; thermal generation;
D O I
10.1109/TED.2006.883680
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
OFF-state current limitations of two types of MOSFETs, namely 1) flatband-mode MOSFET and 2) inversion-mode MOSFET, with narrow bandgap channel materials such as InSb, InAs, InGaAs, and Ge are discussed in conjunction with long-term requirements of the International Technology Roadmap for Semiconductors (ITRS). Flatband-mode high-mobility MOSFETs appear to be better suited for low OFF-state currents, in particular when a backside contact is used for minority carrier extraction. Based on OFF-state thermal minority carrier generation in narrow bandgap materials at room temperature, Hatband MOSFETs with InSb channels appear to be applicable for highperformance logic and even low operating power requirements of the long-term ITRS; however, standby power requirements will demand InAs or channels of higher bandgap unless material and interface quality (and, thus, carrier lifetime) is substantially improved. The effects of drain-induced barrier lowering, band-to-band tunneling, impact ionization, and increased temperature on OFF-state currents are not considered here but may impose further restrictions.
引用
收藏
页码:2773 / 2778
页数:6
相关论文
共 20 条
[1]  
[Anonymous], 1999, HDB SERIES SEMICONDU
[2]  
Ashley T, 2004, 2004: 7TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUITS TECHNOLOGY, VOLS 1- 3, PROCEEDINGS, P2253
[3]  
ASHLEY T, 2003, P IEEE INT SEM DEV R, P196
[4]   Staggered to straddling band lineups in InAs/Al(As,Sb) [J].
Bhargava, S ;
Blank, HR ;
Hall, E ;
Chin, MA ;
Kroemer, H ;
Narayanamurti, V .
APPLIED PHYSICS LETTERS, 1999, 74 (08) :1135-1137
[5]   AlSb/InAs HEMT's for low-voltage, high-speed applications [J].
Boos, JB ;
Kruppa, W ;
Bennett, BR ;
Park, D ;
Kirchoefer, SW ;
Bass, R ;
Dietrich, HB .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1998, 45 (09) :1869-1875
[6]   COMPARATIVE-ANALYSIS OF THE OPTICAL-QUALITY OF SINGLE IN0.1GA0.9AS/AL0.33GA0.67AS QUANTUM-WELLS GROWN BY MOLECULAR-BEAM EPITAXY ON (100) AND (311) GAAS SUBSTRATES [J].
BRANDT, O ;
KANAMOTO, K ;
TSUGAMI, M ;
ISU, T ;
TSUKADA, N .
APPLIED PHYSICS LETTERS, 1995, 67 (13) :1885-1887
[7]  
Chau R, 2004, 2004 4TH IEEE CONFERENCE ON NANOTECHNOLOGY, P3
[8]  
*GAT MOD INC, 1998, G PISC IIB MAN
[9]   Monte Carlo simulations of high-speed InSb-InAlSbFETs [J].
Herbert, DC ;
Childs, PA ;
Abram, RA ;
Crow, GC ;
Walmsley, M .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2005, 52 (06) :1072-1078
[10]  
Lee ML, 2003, 2003 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, TECHNICAL DIGEST, P429