Effects of composition and temperature on gel-formed TiO2/SiO2 films

被引:19
作者
Zhai, JW
Zhang, LY
Yao, X
机构
[1] Tongji Univ, Funct Mat Res Lab, Shanghai 200091, Peoples R China
[2] Xian Jiao Tong Univ, Elect Mat Res Lab, Xian 710049, Peoples R China
关键词
D O I
10.1016/S0022-3093(99)00569-4
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Structure and crystal grain size distribution along the thickness of TiO2/SiO2 thin films prepared by the sol-gel process under various heating temperatures were studied. The X-ray diffraction spectra indicated that the crystalline forms of TiO2 in the film depend on the TiO2, content. The phase transformation kinetics depend on the anatase particle size. X-ray grazing incidence analyses indicated that the crystal size decreases along the thickness of the thin film. Increasing the heat-treatment temperature increased the difference in crystal size along the depth of thin film. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:160 / 163
页数:4
相关论文
共 6 条
[1]   A RAMAN-STUDY OF TIO2-SIO2 GLASSES PREPARED BY SOL-GEL PROCESSES [J].
BEST, MF ;
CONDRATE, RA .
JOURNAL OF MATERIALS SCIENCE LETTERS, 1985, 4 (08) :994-998
[2]  
FABES BD, 1990, SPIE, V1328, P319
[3]  
MACKENZIE JD, 1993, NIPPON SERAM KYO GAK, V101, P1, DOI 10.2109/jcersj.101.1
[4]   STRESS IN THICK SOL-GEL PHOSPHOSILICATE GLASS-FILMS FORMED ON SI SUBSTRATES [J].
SYMS, RRA .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1994, 167 (1-2) :16-20
[5]   DEPOSITION OF THICK SILICA TITANIA SOL-GEL FILMS ON SI SUBSTRATES [J].
SYMS, RRA ;
HOLMES, AS .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1994, 170 (03) :223-233
[6]  
UHLMANN DR, 1990, SPIE, V1328, P270