Photoinduced expansion in hydrogenated amorphous silicon

被引:10
作者
Nonomura, S [1 ]
Gotoh, T [1 ]
Nishio, M [1 ]
Sakamoto, T [1 ]
Kondo, M [1 ]
Matsuda, A [1 ]
Nitta, S [1 ]
机构
[1] Gifu Univ, Dept Elect Engn, Gifu 5011193, Japan
来源
AMORPHOUS AND HETEROGENEOUS SILICON THIN FILMS: FUNDAMENTALS TO DEVICES-1999 | 1999年 / 557卷
关键词
D O I
10.1557/PROC-557-337
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The structural aspect of photodegradation effect in hydrogenated amorphous silicon has been investigated by the use of the simple and sensitive detection technique, the laser optical-lever bending method, for a small expansion or extraction in thin films. The volume change induced by the thermal expansion due to the photothermal effect and the residual expansion was observed in hydrogenated amorphous silicon prepared by PECVD. The latter residual expansion was persistent after light soaking and was recovered by thermal annealing at 200 degrees C. The time dependence of the volume expansion with light soaking shows the same time dependence of photoinduced defect density. The photoinduced volume changes normalized by the initial volume are the order of 10(-6)similar to 10(-5), which values are two orders smaller than chalcogenide glasses such as a-As2S3. The normalized volume change of a-Si:H with the different sample preparation conditions of PECVD such as the hydrogen dilution ratio r (r = SiH4/H-2) and substrate temperature is shown. Also it is demonstrated that the photoinduced expansion is observed in hydrogenated amorphous silicon prepared by photo CVD and hotwire CVD methods. The spatial extent related to a photoinduced defect creation in a-Si:H is estimated.
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页码:337 / 345
页数:9
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