Rapid imaging of nanotubes on insulating substrates

被引：102

作者：

Brintlinger, T

Chen, YF

Dürkop, T

Cobas, E

Fuhrer, MS ^{[1
]}

Barry, JD

Melngailis, J

机构：

[1] Univ Maryland, Dept Phys, College Pk, MD 20742 USA

[2] Inst Res Elect & Appl Phys, College Pk, MD 20742 USA

来源：

APPLIED PHYSICS LETTERS | 2002年 / 81卷 / 13期

关键词：

D O I：

10.1063/1.1509113

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We demonstrate the use of field-emission scanning electron microscopy for rapid imaging of small-diameter carbon nanotubes on insulating SiO2 substrates. The image contrast stems from local potential differences between the nanotube and substrate and is insensitive to surface roughness and defects. This technique may also be used as a probe of the electrical connectivity of small structures without external leads. (C) 2002 American Institute of Physics.

引用

页码：2454 / 2456

页数：3

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