Use of optical methods to characterize thin silane films coated on aluminium

被引:39
作者
Franquet, A
Terryn, H
Bertrand, P
Vereecken, J
机构
[1] Free Univ Brussels, Dept Met Electrochem & Mat Sci, B-1050 Brussels, Belgium
[2] Univ Catholique Louvain, Dept Mat & Proc Sci, Unite Physicochim & Phys Mat, B-1348 Louvain, Belgium
关键词
optical methods; spectroscopic ellipsometry; silane; aluminium; BTSE; curing;
D O I
10.1002/sia.1245
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
For corrosion and adhesion problems, the aluminium and its alloys are usually modified by different surface treatments. Silane coupling agents that are an alternative treatment for the chromate-containing pretreatment are being used more frequently in industry. This paper focuses on the study of a no-rinse system using the non-functional silane bis-1,2-(triethoxysilyl)ethane (BTSE). The objective of this work is to study the effect of curing BTSE films coated on aluminium substrates. Spectroscopic ellipsometry is used to determine the thickness and optical constants of the silane coatings as a function of the curing conditions. It is shown by infrared spectroscopic ellipsometry (IRSE) how the curing causes changes in the chemistry of silane films deposited on aluminium. Indeed, IRSE combines the advantages of the traditional Fourier transform infrared spectroscopy method (molecular information via knowledge of the infrared absorption bands) with those of spectroscopic ellipsometry (morphological information such as film thickness and optical information such as refractive index and extinction coefficient). Copyright (C) 2002 John Wiley Sons, Ltd.
引用
收藏
页码:25 / 29
页数:5
相关论文
共 14 条
[1]  
[Anonymous], 1987, SILICON COMPOUNDS RE
[2]  
Born M., 1975, PRINCIPLES OPTICS
[4]  
COLLIE MJ, 1983, CORROSION INHIBITORS, P182
[5]  
DELAET J, 1992, APPL PHYS A-MATER, V54, P72, DOI 10.1007/BF00348134
[6]   Determination of the thickness of thin silane films on aluminium surfaces by means of spectroscopic ellipsometry [J].
Franquet, A ;
De Laet, J ;
Schram, T ;
Terryn, H ;
Subramanian, V ;
van Ooij, WJ ;
Vereecken, J .
THIN SOLID FILMS, 2001, 384 (01) :37-45
[7]  
HINTON BRW, 1991, MET FINISH, V89, P55
[8]   The calculation of thin film parameters from spectroscopic ellipsometry data [J].
Jellison, GE .
THIN SOLID FILMS, 1996, 290 :40-45
[9]  
Plueddemann E.P., 1990, SILANE COUPLING AGEN
[10]  
Schrader B, 1995, INFRARED RAMAN SPECT