Electrostatic forces in atomic force microscopy

被引：83

作者：

Law, BM

Rieutord, F

机构：

[1] Kansas State Univ, Dept Phys, Condensed Matter Lab, Manhattan, KS 66506 USA

[2] CEA, Dept Rech Fondamentale Mat Condensee, F-38054 Grenoble 9, France

来源：

PHYSICAL REVIEW B | 2002年 / 66卷 / 03期

关键词：

D O I：

10.1103/PhysRevB.66.035402

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this paper we quantitatively compare various electrostatic models, which describe the interaction of a polarized atomic force microscopy tip with a molecularly smooth and grounded substrate, with a large experimental data set collected at many different tip potentials. The model by Hudlet [Eur. Phys. J. B 2, 5 (1998)] provides an excellent description of the experimental data for tip parameters (height H, cone half-angle theta(0), and tip radius R-0) close to their typical values, provided contributions from the cantilever body are included.

引用

收藏

页码：354021 / 354026

页数：6

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