Toward the next generation of atomic mass spectrometers - Plenary lecture

被引:41
作者
Hieftje, GM
Myers, DP
Li, GQ
Mahoney, PP
Burgoyne, TW
Ray, SJ
Guzowski, JP
机构
[1] Department of Chemistry, Indiana University, Bloomington
关键词
inductively coupled plasma mass spectrometry; time-of-flight mass spectrometry; glow discharge mass spectrometry; instrumentation; plasma-source mass spectrometry;
D O I
10.1039/a605067k
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Atomic mass spectrometry, embodied principally as ICP mass spectrometry (ICP-MS) and glow discharge mass spectrometry (GDMS), has enjoyed rapid growth during the last decade, yet both methods exhibit shortcomings that would be desirable to reduce or eliminate, Prominent among these shortcomings are drift and limited precision, several troublesome spectral and matrix interferences, and moderate atom-detection efficiency. This last limitation is particularly troublesome when ICP-MS, for example, must be interfaced to analytical systems that deliver extremely small sample volumes or low flow rates or when extremely limited sample sizes must be examined, Such situations are projected to be increasingly common in the next decade because of the importance of biotechnology and nanostructured materials. Overcoming these limitations will require substantial modifications in both sources and mass-spectrometer designs, Sources will be required that are more efficient at sample utilization, aerosol volatilization and atomization and that provide multidimensional information. Similarly, mass spectrometers of the future must be more atom-efficient, should measure all elements and isotopes simultaneously, and must operate on a time scale that is compatible with microsampling and transient-sampling technology, Possible alternative systems that meet these criteria will be outlined and their likely performance assessed. Greatest emphasis is placed on time-of-flight mass spectrometry coupled with an ICP source.
引用
收藏
页码:287 / 292
页数:6
相关论文
共 27 条
[1]   A GLOW-DISCHARGE ION-SOURCE WITH FOURIER-TRANSFORM ION-CYCLOTRON RESONANCE MASS-SPECTROMETRIC DETECTION [J].
BARSHICK, CM ;
EYLER, JR .
JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 1992, 3 (02) :122-127
[2]  
BURGOYNE TW, 1993, 41 ASMS C MASS SPECT
[3]  
BURGOYNE TW, 1996, IN PRESS J AM SOC MA
[4]   Novel multichannel plasma-source mass spectrometer [J].
Cromwell, EF ;
Arrowsmith, P .
JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 1996, 7 (05) :458-466
[5]   DYNAMIC-RANGE EXTENSION IN GLOW-DISCHARGE QUADRUPOLE ION-TRAP MASS-SPECTROMETRY [J].
DUCKWORTH, DC ;
BARSHICK, CM ;
SMITH, DH ;
MCLUCKEY, SA .
ANALYTICAL CHEMISTRY, 1994, 66 (01) :92-98
[6]   Selective removal of plasma matrix ions in plasma source mass spectrometry [J].
Eiden, GC ;
Barinaga, CJ ;
Koppenaal, DW .
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 1996, 11 (04) :317-322
[7]   The future of plasma spectrochemical instrumentation [J].
Hieftje, GM .
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 1996, 11 (09) :613-621
[8]   DESIGN CONSIDERATIONS, CALIBRATION AND APPLICATIONS OF AN ARRAY DETECTOR FOR A 4-SECTOR TANDEM MASS-SPECTROMETER [J].
HILL, JA ;
BILLER, JE ;
MARTIN, SA ;
BIEMANN, K ;
YOSHIDOME, K ;
SATO, K .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1989, 92 :211-230
[9]   PERFORMANCE OF AN INDUCTIVELY-COUPLED PLASMA SOURCE ION-TRAP MASS-SPECTROMETER [J].
KOPPENAAL, DW ;
BARINAGA, CJ ;
SMITH, MR .
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 1994, 9 (09) :1053-1058
[10]  
LI G, 1995, Patent No. 8434931