Electron spectroscopies and partial excitation spectra in Cr2O3

Polycrystalline Cr2O3 films grown on Cr metal have been measured by photoemission (PES), inverse photoemission (IPES, BIS) and electron-energy-loss spectroscopy (EELS). The high energy EELS data exhibit three structures in the range up to 15 eV loss energy which can be identified with transitions from occupied to unoccupied states in the combined XPS/BIS spectra. The valence band PES data measured at XPS, He-I and He-II photon energies are decomposed into the Cr-Sd and O-2p contributions showing strong hybridizations over the whole valence band range and an occupation of about 3d(4.15) of th, Cr-Sd state. A valence band satellite observed at about 14 eV is similar to those in the Cr core level spectra and may therefore be identified as a many body satellite from photoemission of localized Cr-3d electrons.