Three-dimensional characterization of drug-encapsulating particles using STEM detector in FEG-SEM

被引:11
作者
Barkay, Zahava [1 ]
Rivkin, Ilia [2 ]
Margalit, Rimona [2 ]
机构
[1] Tel Aviv Univ, Wolfson Appl Mat Res Ctr, IL-69978 Tel Aviv, Israel
[2] Tel Aviv Univ, Dept Biochem, Fac Life Sci, IL-69978 Tel Aviv, Israel
关键词
Low energy STEM; SEM; Mass-thickness contrast; Drug-encapsulating particles; SCANNING-ELECTRON-MICROSCOPY; LOW-ENERGY; WET-STEM; SCATTERING; RESOLUTION;
D O I
10.1016/j.micron.2008.12.003
中图分类号
TH742 [显微镜];
学科分类号
摘要
New drug-encapsulating particles were investigated using bright field (BF) scanning transmission electron Microscopy (STEM) in a field emission gun (FEG) scanning electron microscope (SEM). Thickness characterization was done based on measuring the effective cross-section for interaction in our sample-detector configuration using calibration particles. A simplified analytical model, taking account of BF-STEM contrast and effective cross-section for interaction, was utilized for transforming projected two-dimensional BF-STEM images into three-dimensional thickness images. The three-dimensional characterization is demonstrated on a new family of biological materials composed of submicron to Micron drug-free and drug-encapsulating particles. The importance of using BF-STEM in SEM, relative to other electron microscopy methods, is discussed as well as the lateral and depth resolution. (C) 2008 Elsevier Ltd. All rights reserved.
引用
收藏
页码:480 / 485
页数:6
相关论文
共 17 条
  • [1] Atomic force and scanning electron microscopy of atmospheric particles
    Barkay, Z
    Teller, A
    Ganor, E
    Levin, Z
    Shapira, Y
    [J]. MICROSCOPY RESEARCH AND TECHNIQUE, 2005, 68 (02) : 107 - 114
  • [2] A history of scanning electron microscopy developments: Towards "wet-STEM" imaging
    Bogner, A.
    Jouneau, P. -H.
    Thollet, G.
    Basset, D.
    Gauthier, C.
    [J]. MICRON, 2007, 38 (04) : 390 - 401
  • [3] Wet STEM: A new development in environmental SEM for imaging nano-objects included in a liquid phase
    Bogner, A
    Thollet, G
    Basset, D
    Jouneau, PH
    Gauthier, C
    [J]. ULTRAMICROSCOPY, 2005, 104 (3-4) : 290 - 301
  • [4] Dopant profiling with the scanning electron microscope - A study of Si
    Elliott, SL
    Broom, RF
    Humphreys, CJ
    [J]. JOURNAL OF APPLIED PHYSICS, 2002, 91 (11) : 9116 - 9122
  • [5] Hall C.E., 1966, Introduction to Electron Microscopy
  • [6] SCATTERING PHENOMENA IN ELECTRON MICROSCOPE IMAGE FORMATION
    HALL, CE
    [J]. JOURNAL OF APPLIED PHYSICS, 1951, 22 (05) : 655 - 662
  • [7] Keyse R.J., 1998, INTRO SCANNING TRANS
  • [8] Low-energy STEM of multilayers and dopant profiles
    Merli, PG
    Morandi, V
    [J]. MICROSCOPY AND MICROANALYSIS, 2005, 11 (01) : 97 - 104
  • [9] Backscattered electron imaging and scanning transmission electron microscopy imaging of multi-layers
    Merli, PG
    Morandi, V
    Corticelli, F
    [J]. ULTRAMICROSCOPY, 2003, 94 (02) : 89 - 98
  • [10] PEER D, 2006, Patent No. 2006050246