Scanning probe microscopy measurements of friction

被引:25
作者
Perry, SS
机构
[1] University of Houston, Center for Materials Chemistry, Houston
关键词
atomic force microscopy; interfacial friction; scanning probe microscopy; tribology;
D O I
10.1557/mrs2004.142
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This article describes the details of scanning probe microscopy measurements of interfacial friction from an experimental perspective. In such studies, the probe tip is taken as a model of a single asperity within a tribiological contact, and interfacial forces are measured as function of the sliding contact of the probe tip with the surface. With appropriate detection schemes, friction and load forces can be monitored simultaneously and used together to describe the frictional properties of the microscopic contact. This article provides a detailed description of the procedures and protocols of friction measurements performed with scanning probe microscopy, the relevant properties of probe tips, and the influence of envoirnment on microscopic friction measurements. In addition, this article provides a brief overview of several categories of friction studies performed with scanning probe microscopy, highlighting the type of materials characterized in these studies as well as the importance and impact of the microscopic measurements.
引用
收藏
页码:478 / 483
页数:6
相关论文
共 70 条
[1]  
[Anonymous], MACROMOLECULES
[2]   INFLUENCE OF WATER-VAPOR ON NANOTRIBOLOGY STUDIED BY FRICTION FORCE MICROSCOPY [J].
BINGGELI, M ;
MATE, CM .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (03) :1312-1315
[3]   INFLUENCE OF CAPILLARY CONDENSATION OF WATER ON NANOTRIBOLOGY STUDIED BY FORCE MICROSCOPY [J].
BINGGELI, M ;
MATE, CM .
APPLIED PHYSICS LETTERS, 1994, 65 (04) :415-417
[4]   Tip friction - torsional spring constant determination [J].
Bogdanovic, G ;
Meurk, A ;
Rutland, MW .
COLLOIDS AND SURFACES B-BIOINTERFACES, 2000, 19 (04) :397-405
[5]   Atomic force microscopy calibration methods for lateral force, elasticity, and viscosity [J].
Buenviaje, CK ;
Ge, SR ;
Rafailovich, MH ;
Overney, RM .
FUNDAMENTALS OF NANOINDENTATION AND NANOTRIBOLOGY, 1998, 522 :187-192
[6]   Force calibration in lateral force microscopy [J].
Cain, RG ;
Biggs, S ;
Page, NW .
JOURNAL OF COLLOID AND INTERFACE SCIENCE, 2000, 227 (01) :55-65
[7]   Quantitative comparison of three calibration techniques for the lateral force microscope [J].
Cain, RG ;
Reitsma, MG ;
Biggs, S ;
Page, NW .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2001, 72 (08) :3304-3312
[8]   Large friction anisotropy of a polydiacetylene monolayer [J].
Carpick, RW ;
Sasaki, DY ;
Burns, AR .
TRIBOLOGY LETTERS, 1999, 7 (2-3) :79-85
[9]   Scratching the surface: Fundamental investigations of tribology with atomic force microscopy [J].
Carpick, RW ;
Salmeron, M .
CHEMICAL REVIEWS, 1997, 97 (04) :1163-1194
[10]   Glass transitions of thin polymeric films: Speed and load dependence in lateral force microscopy [J].
Dinelli, F ;
Buenviaje, C ;
Overney, RM .
JOURNAL OF CHEMICAL PHYSICS, 2000, 113 (05) :2043-2048