Force calibration in lateral force microscopy

被引:71
作者
Cain, RG
Biggs, S
Page, NW
机构
[1] Univ Newcastle, Dept Mech Engn, Newcastle, NSW 2308, Australia
[2] Univ Newcastle, Dept Chem, Newcastle, NSW 2308, Australia
基金
澳大利亚研究理事会;
关键词
friction; contact stiffness; atomic force microscopy; silica;
D O I
10.1006/jcis.2000.6840
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
An analysis of the contact mechanics and the forces of interaction in lateral force microscopy measurements is presented, This analysis allows for a new method of interpretation of the frictional forces, the lateral contact stiffness, and the contact shear strength. The technique was developed for the interpretation of frictional data obtained with colloidal probes, although results are presented which illustrate its ability to interpret measurements recorded with both colloidal probes and standard atomic force microscopy tips. The technique is found to compensate for the variations in the contact geometry, giving repeatable results for probes of different sizes. A critical review of other techniques which have been employed to interpret the frictional force in lateral force microscopy is also presented. (C) 2000 Academic Press.
引用
收藏
页码:55 / 65
页数:11
相关论文
共 35 条
  • [1] [Anonymous], 1950, FRICTION LUBRICATION
  • [2] [Anonymous], 1984, STRUCTURAL ADHESIVE, DOI DOI 10.1007/978-94-009-5616-2
  • [3] CAIN RG, 1998, AUSTRIB 98 TECHNOLOG, P155
  • [4] CAIN RG, 1998, WORLD C PART TECHN 3
  • [5] Lateral stiffness: A new nanomechanical measurement for the determination of shear strengths with friction force microscopy
    Carpick, RW
    Ogletree, DF
    Salmeron, M
    [J]. APPLIED PHYSICS LETTERS, 1997, 70 (12) : 1548 - 1550
  • [6] Measurement of interfacial shear (friction) with an ultrahigh vacuum atomic force microscope
    Carpick, RW
    Agrait, N
    Ogletree, DF
    Salmeron, M
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02): : 1289 - 1295
  • [7] Scratching the surface: Fundamental investigations of tribology with atomic force microscopy
    Carpick, RW
    Salmeron, M
    [J]. CHEMICAL REVIEWS, 1997, 97 (04) : 1163 - 1194
  • [8] A NONDESTRUCTIVE METHOD FOR DETERMINING THE SPRING CONSTANT OF CANTILEVERS FOR SCANNING FORCE MICROSCOPY
    CLEVELAND, JP
    MANNE, S
    BOCEK, D
    HANSMA, PK
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (02) : 403 - 405
  • [9] DIRECT MEASUREMENT OF COLLOIDAL FORCES USING AN ATOMIC FORCE MICROSCOPE
    DUCKER, WA
    SENDEN, TJ
    PASHLEY, RM
    [J]. NATURE, 1991, 353 (6341) : 239 - 241
  • [10] MEASUREMENT OF FORCES IN LIQUIDS USING A FORCE MICROSCOPE
    DUCKER, WA
    SENDEN, TJ
    PASHLEY, RM
    [J]. LANGMUIR, 1992, 8 (07) : 1831 - 1836