Quantifying texture in ferroelectric bismuth titanate ceramics

被引：25

作者：

Jones, JL ^{[1
]}

Vogel, SC

Slamovich, EB

Bowman, KJ

机构：

[1] Univ New S Wales, Sydney, NSW 2052, Australia

[2] Purdue Univ, W Lafayette, IN 47907 USA

[3] Los Alamos Natl Lab, Los Alamos, NM 87645 USA

来源：

SCRIPTA MATERIALIA | 2004年 / 51卷 / 12期

基金：

美国国家科学基金会;

关键词：

texture; neutron diffraction; X-ray diffraction (XRD); ferroelectricity; piezoelectricity;

D O I：

10.1016/j.scriptamat.2004.08.020

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The orientation distribution function of a modestly textured bismuth titanate ceramic is calculated from full-pattern Rietveld refinement of time-of-flight neutron and X-ray area detector spectra and measured pole figures from synchrotron X-ray diffraction. The recalculated 00l pole figures are consistent, demonstrating the validity of the texture descriptions introduced for this system. (C) 2004 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

页码：1123 / 1127

页数：5

共 34 条

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Lutterotti L., 1999, Proceeding of the Twelfth International Conference on Textures of Materials (ICOTOM-12), V1, P1599

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