Scanning probe microscope tip with carbon nanotube truss

被引：3

作者：

Akita, S

Nakayama, Y

机构：

[1] Osaka Prefecture Univ, Dept Phys & Elect, Sakai, Osaka 5998531, Japan

[2] Osaka Univ, Grad Sch Engn, Handai Frontier Res Ctr, Suita, Osaka 5650871, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2004年 / 43卷 / 7B期

关键词：

carbon nanotube; nanomanipulation; nanomechanics;

D O I：

10.1143/JJAP.43.4499

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have fabricated a scanning probe microscope tip with a truss consisting of two nanotubes using a scanning electron microscope manipulator. The tip of the nanotube truss was successfully positioned on the optical axis of a tapered optical fiber used as the base. Force curve measurements for the nanotube truss were also performed using the manipulator to investigate the mechanical strength of the truss. The stiffness of the truss was 3.5 higher than that of the individual nanotube.

引用

页码：4499 / 4501

页数：3

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