Self-marking phase-stepping electronic speckle pattern interfometry (ESPI) for 3D displacement measurement on cathode ray tube (CRT)-panels

被引:6
作者
Huang, MJ [1 ]
Liu, ZC [1 ]
Jhang, JH [1 ]
机构
[1] Natl Chung Hsing Univ, Dept Mech Engn, Holog Lab, Taichung 40227, Taiwan
关键词
ESPI; phase-shifting technique; phase unwrapping; CRT; sensitivity vector;
D O I
10.1016/S0143-8166(01)00169-5
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This study demonstrates the feasibility of applying phase-shifting electronic speckle pattern interfometry to measure the deformation field of the front panel of a cathode ray tube, to support analysis to enhance the implosion-resistance capacity under violent collapse. Two effects, the air exhaustion and shrink band constraint effects, are comprehensively investigated, The angle of an adjustable mirror is switched, to provide three sensitivity vectors that are required in 3D-displacement measurement. A Fourier filtration is employed to remove speckle noise and establish a noise-free phase map. Inconsistent points are identified and masked to prevent any possible divergence during phase unwrapping. The results show that the accuracy of this method is satisfactory. (C) 2002 Elsevier Science Ltd, All rights reserved.
引用
收藏
页码:245 / 260
页数:16
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