Fractality of porous silicas: A comparison of adsorption and porosimetry data

被引:33
作者
Fadeev, AY
Borisova, OR
Lisichkin, GV
机构
[1] Laboratory of Organic Catalysis, Department of Chemistry, Moscow State University, Vorob. G., 119899, Moscow
关键词
surface fractals; porous silica; silane chemisorption; porosimetry;
D O I
10.1006/jcis.1996.0511
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The fractal dimensions of seven porous silicas were determined by means of gas adsorption, chemisorption of chlorosilanes, and mercury porosimetry. The silicas under investigation are shown to be surface fractals in the range of cross-sectional areas from 0.162 (N-2) to 1,450 sq. mn ((C6H13)(3)SiCl). The surface fractal dimensions obtained range from 2.05 to 2.90. On the other hand, mercury porosimetry data show that the silicas studied can be hardly considered as pore fractals within the range of a pore radius from 3.5 to 1000 nm. The apparent contradiction is discussed in the text. (C) 1996 Academic Press, Inc.
引用
收藏
页码:1 / 5
页数:5
相关论文
共 42 条
[31]  
PFEIFER P, 1987, PREPARATIVE CHEM USI, P13
[32]  
PFEIFER P, 1984, J COLLOID INTERF SCI, V103, P112
[33]  
PFEIFER P, 1983, J CHEM PHYS, V79, P3666
[34]   TIME-RESOLVED FLUORESCENCE DEPOLARIZATION MEASUREMENTS IN MESOPOROUS SILICAS - THE FRACTAL APPROACH [J].
PINES, D ;
HUPPERT, D .
JOURNAL OF PHYSICAL CHEMISTRY, 1987, 91 (27) :6569-6572
[35]  
PINES D, 1988, J CHEM PHYS, V92, P4734
[36]   PORE-SIZE EFFECTS ON THE FRACTAL DISTRIBUTION OF ADSORBED ACCEPTOR MOLECULES AS REVEALED BY ELECTRONIC-ENERGY TRANSFER ON SILICA SURFACES [J].
PINESROJANSKI, D ;
HUPPERT, D ;
AVNIR, D .
CHEMICAL PHYSICS LETTERS, 1987, 139 (01) :109-115
[37]   THE APPLICATION OF SAXS TO DETERMINE THE FRACTAL PROPERTIES OF POROUS CARBON-BASED MATERIALS [J].
REICH, MH ;
RUSSO, SP ;
SNOOK, IK ;
WAGENFELD, HK .
JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1990, 135 (02) :353-362
[38]   INTEGRATED FRACTAL ANALYSIS OF SILICA - ADSORPTION, ELECTRONIC-ENERGY TRANSFER, AND SMALL-ANGLE X-RAY-SCATTERING [J].
ROJANSKI, D ;
HUPPERT, D ;
BALE, HD ;
DACAI, X ;
SCHMIDT, PW ;
FARIN, D ;
SERILEVY, A ;
AVNIR, D .
PHYSICAL REVIEW LETTERS, 1986, 56 (23) :2505-2508
[39]   SURFACE-ROUGHNESS IN VAPOR-PHASE AGGREGATES VIA ADSORPTION AND SCATTERING TECHNIQUES [J].
ROSS, SB ;
SMITH, DM ;
HURD, AJ ;
SCHAEFER, DW .
LANGMUIR, 1988, 4 (04) :977-982
[40]   SMALL-ANGLE X-RAY-SCATTERING STUDY OF THE FRACTAL MORPHOLOGY OF POROUS SILICAS [J].
SCHMIDT, PW ;
HOHR, A ;
NEUMANN, HB ;
KAISER, H ;
AVNIR, D ;
LIN, JS .
JOURNAL OF CHEMICAL PHYSICS, 1989, 90 (09) :5016-5023