Determination of the thickness of Al2O3 barriers in magnetic tunnel junctions

被引:33
作者
Buchanan, JDR
Hase, TPA
Tanner, BK
Hughes, ND
Hicken, RJ
机构
[1] Univ Durham, Dept Phys, Durham DH1 3LE, England
[2] Univ Exeter, Sch Phys, Exeter EX4 4QL, Devon, England
关键词
D O I
10.1063/1.1496131
中图分类号
O59 [应用物理学];
学科分类号
摘要
The barrier thickness in magnetic spin-dependent tunnel junctions with Al2O3 barriers has been measured using grazing incidence x-ray reflectivity and by fitting the tunneling current to the Simmons model. We have studied the effect of glow discharge oxidation time on the barrier structure, revealing a substantial increase in Al2O3 thickness with oxidation. The greater thickness of barrier measured using grazing incidence x-ray reflectivity compared with that obtained by fitting current density-voltage to the Simmons electron tunneling model suggests that electron tunneling is localized to specific regions across the barrier, where the thickness is reduced by fluctuations due to nonconformal roughness. (C) 2002 American Institute of Physics.
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页码:751 / 753
页数:3
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