Near-field scanning optical microscope using a metallized cantilever tip for nanospectroscopy

被引：61

作者：

Inouye, Y ^{[1
]}

Hayazawa, N ^{[1
]}

Hayashi, K ^{[1
]}

Sekkat, Z ^{[1
]}

Kawata, S ^{[1
]}

机构：

[1] Osaka Univ, Dept Appl Phys, Suita, Osaka 5650871, Japan

来源：

NEAR-FIELD OPTICS: PHYSICS, DEVICES, AND INFORMATION PROCESSING | 1999年 / 3791卷

关键词：

near-field optics; localized surface plasmon polariton; apertuless NSOM; fluorescence; surface enhanced Raman scattering;

D O I：

10.1117/12.363860

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We have developed a NSOM which has a metallic probe tip and a highly focused evanescent light field spot. Evanescent illumination effectively rejects the background light, e.g. the stray light from the shaft of the probe. By suppressing the stray light and utilizing the field enhancement generated by the metallic probe, a sudden increment of the fluorescence was observed in the near-field region. We have used this for near-field Raman scattering detection of molecules vibrations with the aid of surface enhanced Raman scattering. One specific stokes-Raman-shifted lines was observed by near-field excitation together with several other lines that were excited by the far-field light.

引用

页码：40 / 48

页数：9

共 12 条

[1] NEAR-FIELD OPTICAL MICROSCOPE BASED ON LOCAL PERTURBATION OF A DIFFRACTION SPOT [J].

BACHELOT, R ;

GLEYZES, P ;

BOCCARA, AC .

OPTICS LETTERS, 1995, 20 (18) :1924-1926

[2] Near-field surface enhanced Raman imaging of dye-labeled DNA with 100-nm resolution [J].

Deckert, V ;

Zeisel, D ;

Zenobi, R ;

Vo-Dinh, T .

ANALYTICAL CHEMISTRY, 1998, 70 (13) :2646-2650

[3] OBSERVATION OF SINGLE-PARTICLE PLASMONS BY NEAR-FIELD OPTICAL MICROSCOPY [J].

FISCHER, UC ;

POHL, DW .

PHYSICAL REVIEW LETTERS, 1989, 62 (04) :458-461

[4] Local field enhancement with an apertureless near-field-microscope probe [J].

Furukawa, H ;

Kawata, S .

OPTICS COMMUNICATIONS, 1998, 148 (4-6) :221-224

[5]

Hayazawa N, 1999, J MICROSC-OXFORD, V194, P472, DOI 10.1046/j.1365-2818.1999.00563.x

[6] A SCANNING NEAR-FIELD OPTICAL MICROSCOPE HAVING SCANNING ELECTRON-TUNNELING MICROSCOPE CAPABILITY USING A SINGLE METALLIC PROBE TIP [J].

INOUYE, Y ;

KAWATA, S .

JOURNAL OF MICROSCOPY-OXFORD, 1995, 178 :14-19

[7] Reflection-mode near-field optical microscope with a metallic probe tip for observing fine structures in semiconductor materials [J].

Inouye, Y ;

Kawata, S .

OPTICS COMMUNICATIONS, 1997, 134 (1-6) :31-35

[8] NEAR-FIELD SCANNING OPTICAL MICROSCOPE WITH A METALLIC PROBE TIP [J].

INOUYE, Y ;

KAWATA, S .

OPTICS LETTERS, 1994, 19 (03) :159-161

[9] Probing single molecules and single nanoparticles by surface-enhanced Raman scattering [J].

Nie, SM ;

Emery, SR .

SCIENCE, 1997, 275 (5303) :1102-1106

[10]

Raether H., 1988, SURFACE PLASMONS SMO

← 1 2 →