Chemical stability of sputtered Mo/Sb2Te3 and Ni/Sb2Te3 layers in view of stable back contacts for CdTe/CdS thin film solar cells

被引：25

作者：

Abken, AE ^{[1
]}

机构：

[1] Inst Solarenergieforsch GMBH, D-30165 Hannover, Germany

来源：

SOLAR ENERGY MATERIALS AND SOLAR CELLS | 2002年 / 73卷 / 04期

关键词：

Sb2Te(3); CdTe; CdS; thin film solar cell; back contact; stability;

D O I：

10.1016/S0927-0248(02)00207-6

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

Sb-Te phases sputtered from an Sb2Te3/Sb/Te target in a substrate temperature range from 293 to 523 K are characterised by X-ray diffraction (XRD) and Hall measurements. A simple thermodynamic model is introduced for estimating the chemical stability of the Ni/Sb2Te3 and the Mo/Sb2Te3 interface. These data and the results of kinetic test reactions for sputtered Ni/Sb2Te3, Ni/Sb-Te, Mo/Sb2Te3 and Mo/Sb-Te layers are compared using XRD measurements. Metal/Sb2Te3 thin film double-layer systems are used as a model for an innovative back contact for CdTe/CdS thin film solar cells offering an improved long-term stability. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：391 / 409

页数：19

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