Electronic structure of high-k transition metal oxides and their silicate and aluminate alloys

被引:46
作者
Lucovsky, G [1 ]
Zhang, Y
Rayner, GB
Appel, G
Ade, H
Whitten, JL
机构
[1] N Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA
[2] N Carolina State Univ, Dept Chem, Raleigh, NC 27695 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2002年 / 20卷 / 04期
关键词
D O I
10.1116/1.1493787
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This article addresses differences between the electronic structure of: (i) alternative high-k transition metal (TM) rare earth dielectrics and (ii) SiO2 and Si oxynitride alloys by presenting a systematic x-ray absorption spectroscopy study of transitions between TM n p-core states and TM metal n + 1 - d* and n + 2 s * antibonding/conduction band states (n = 2, 3, and 4) that is complemented by studies of O atom K-1 edge absorption spectra. Ab initio calculations based on small clusters establish the localization of the n + 1 d* states on the TM metals. Ab initio electronic structure calculations are also used to interpret other aspects of the optical, ultraviolet, x-ray, and electron spectroscopies, and also provide a basis for interpretation of electrical results, thereby narrowing the field of possible replacement dielectrics for advanced semiconductor devices. (C) 2002 American Vacuum Society.
引用
收藏
页码:1739 / 1747
页数:9
相关论文
共 27 条
[1]   Energy barriers between (100)Si and Al2O3 and ZrO2-based dielectric stacks:: internal electron photoemission measurements [J].
Afanas'ev, VV ;
Houssa, M ;
Stesmans, A ;
Adriaenssens, GJ ;
Heyns, MM .
MICROELECTRONIC ENGINEERING, 2001, 59 (1-4) :335-339
[2]  
BALLHAUSEN CJ, 1964, MOL ORBITAL THEORY, pCH8
[3]  
CAMPBELL SA, UNPUB
[4]  
Cox P. A., 1992, TRANSITION METAL OXI
[5]  
HARRISON WA, 1999, ELEMENTARY ELECT STR, pCH17
[6]   Fixed charge and interface traps at heterovalent interfaces between Si(100) and non-crystalline Al2O3-Ta2O5 alloys [J].
Johnson, RS ;
Lucovsky, G ;
Hong, JG .
MICROELECTRONIC ENGINEERING, 2001, 59 (1-4) :385-391
[7]   Electron traps at interfaces between Si(100) and noncrystalline Al2O3, Ta2O5, and (Ta2O5)x(Al2O3)1-x alloys [J].
Johnson, RS ;
Hong, JG ;
Lucovsky, G .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (04) :1606-1610
[8]   Physical and electrical properties of noncrystalline Al2O3 prepared by remote plasma enhanced chemical vapor deposition [J].
Johnson, RS ;
Lucovsky, G ;
Baumvol, I .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2001, 19 (04) :1353-1360
[9]  
JOHNSON RS, IN PRESS J VAC SCI A
[10]  
LIM SG, IN PRESS J APPL PHYS