Mapping concentration profiles within the diffusion layer of an electrode Part I. Confocal resonance Raman microscopy

被引:43
作者
Amatore, C
Bonhomme, F
Bruneel, JL
Servant, L
Thouin, L
机构
[1] Ecole Normale Super, Dept Chim, UMR CNRS 8640 Pasteur, F-75231 Paris 05, France
[2] Univ Bordeaux 1, UMR CNRS 5803, Lab Physicochim Mol, F-33405 Talence, France
关键词
concentration profiles; conproportionation; diffusion; confocal Raman microscopy; spectroelectrochemistry; ultramicroelectrodes;
D O I
10.1016/S1388-2481(00)00015-1
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Confocal microspectroscopy is known to be a very efficient means for probing composition of spatially resolved micrometric volumes inside a macroscopic sample. In this paper, the applicability of confocal Raman microspectroscopy for imaging molecular diffusion at microelectrodes with a micrometric resolution is established. The efficiency and versatility of the method have been tested by probing the composition of the two different diffusion layers which build up in the vicinity of an ultramicroelectrode during reduction of tetracyanoquinodimethane (TCNQ) on its first or second electrochemical wave. This is performed by mapping the concentration profiles of the TCNQ(.-)anion radical under each condition using its resonance Raman spectrum. As a correlation, this provides the first direct experimental proof of a conproportionation reaction taking place when the electrode potential is poised on the second wave of a two-wave EE electrochemical system. In both cases, the concentration profiles of the radical anion TCNQ(.-) agree extremely well with theoretical predictions. (C) 2000 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:235 / 239
页数:5
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