Grazing-incidence x-ray diffraction study of pentacene thin films with the bulk phase structure

被引：46

作者：

Yoshida, Hiroyuki ^{[1
]}

Sato, Naoki ^{[1
]}

机构：

[1] Kyoto Univ, Chem Res Inst, Uji, Kyoto 6110011, Japan

来源：

APPLIED PHYSICS LETTERS | 2006年 / 89卷 / 10期

关键词：

D O I：

10.1063/1.2349307

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The structure of pentacene thin films in the bulk phase having interplane spacing of d(001)=1.44 nm grown on SiO2 was investigated using grazing-incidence x-ray diffraction. The films were prepared with two different methods: one treated with an organic solvent after vacuum deposition and the other thermally treated. Both films are similar in structure to the single crystal reported by Campbell [Acta Crystallogr. 15, 289 (1962)]. (c) 2006 American Institute of Physics.

引用

页数：3

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