Characterization and simulation of GaSb device-related properties

被引:74
作者
Stollwerck, G [1 ]
Sulima, OV
Bett, AW
机构
[1] Freiburg Mat Res Ctr, D-79104 Freiburg, Germany
[2] Fraunhofer Inst Solar Energy Syst, D-79100 Freiburg, Germany
关键词
gallium compounds; photovoltaic cells; photovoltaic cell measurements; modeling;
D O I
10.1109/16.822293
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Device related parameters of GaSb are characterized and simulated based on measurements of photovoltaic cells. Internal quantum efficiencies are simulated to quantify the contributions from band-gap narrowing and the main recombination mechanisms, such as Auger, radiative, and Shockley-Read-Hall recombination, A detailed study of the recombination mechanisms values shows differences between literature data and data derived from comparison of simulation results with measurements on real devices. A new evaluation of these data is given. The evaluation of the band-gap narrowing in n-GaSb is performed by comparison of measurements and simulations of the injection component of the dark current l(01) and open-circuit voltage. Far the first time, a range of possible values for the intrinsic carrier concentration of GaSb at room temperature is given, based on theoretical calculations, and proven with comparison of measured I-01 and open-circuit voltages of GaSb photovoltaic devices.
引用
收藏
页码:448 / 457
页数:10
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