Growth of N-doped and Ga plus N-codoped ZnO films by radical source molecular beam epitaxy

被引:68
作者
Nakahara, K
Takasu, H
Fons, P
Yamada, A
Iwata, K
Matsubara, K
Hunger, R
Niki, S
机构
[1] ROHM Co Ltd, Opt Device R&D Div, Ukyo Ku, Kyoto 6158585, Japan
[2] AIST, Photon Res Inst, Optoelect Mat & Devices Grp, Tsukuba, Ibaraki 3058568, Japan
关键词
doping; molecular beam epitaxy; semiconducting II-VI materials;
D O I
10.1016/S0022-0248(01)01952-2
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
It has been theoretically predicted that the codoping of an acceptor (nitrogen) and a donor (aluminium, gallium, indium) in a 2:1 ratio will enable the fabrication of low resistivity p-type ZnO due to reduction of the Madelung energy making the nitrogen acceptor energy level shallower. We have been growing N-doped and Ga + N codoped ZnO films by radical-source molecular beam epitaxy. Nitrogen and oxygen radicals were separately supplied via radio-frequency radical cells. Nitrogen did not incorporate in ZnO films at the high substrate temperature of 600degreesC. Lower substrate temperatures were necessary for nitrogen incorporation. From the fact that the nitrogen concentration also depended on the Zn fluxes, it is concluded that Zn-rich conditions Lire indispensable for nitrogen doping. The presence of Ga was observed to enhance nitrogen incorporation, one of the predicted effects of codoping. However, high Ga concentrations were found to lead to formation of the additional phase of ZnGa2O4 in ZnO films. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:503 / 508
页数:6
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