Ni/Au contact to silicon quantum dot light-emitting diodes for the enhancement of carrier injection and light extraction efficiency

被引:36
作者
Kim, Baek-Hyun
Cho, Chang-Hee
Park, Seong-Ju [1 ]
Park, Nae-Man
Sung, Gun Yong
机构
[1] Gwangju Inst Sci & Technol, Nanophoton Semicond Lab, Dept Mat Sci & Engn, Kwangju 500712, South Korea
[2] Elect & Telecommun Res Inst, Future Technol Res Div, Taejon 305350, South Korea
关键词
D O I
10.1063/1.2236104
中图分类号
O59 [应用物理学];
学科分类号
摘要
The effect of Ni/Au metal contact on the carrier injection and the electroluminescence of silicon quantum dot light-emitting diodes (LEDs) was investigated. An LED with an annealed Ni/Au contact at 400 degrees C in air showed a lower threshold voltage compared to that of an as-deposited Ni/Au contact by forming a nickel silicide, which has a lower work function than Ni at the interface between metal layers and silicon nitride. The optical output power of the LED with the annealed Ni/Au contact was also increased due to a highly transparent NiO layer and a lowly resistant Au layer. (c) 2006 American Institute of Physics.
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页数:3
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