Orientation dependence of fatigue behavior in relaxor ferroelectric-PbTiO3 thin films

被引:64
作者
Bornand, V [1 ]
Trolier-McKinstry, S [1 ]
Takemura, K [1 ]
Randall, CA [1 ]
机构
[1] Penn State Univ, Dept Mat Sci & Engn, Mat Res Lab, University Pk, PA 16802 USA
关键词
D O I
10.1063/1.372442
中图分类号
O59 [应用物理学];
学科分类号
摘要
Pb[Yb1/2Nb1/2]O-3-PbTiO3 (PYbN-PT)/SrRuO3 (SRO) capacitors with Pt top electrodes were grown by pulsed laser deposition onto (100)(pc) LaAlO3 (LAO) and (111)(c) SrTiO3 (STO) substrates (the subscripts pc and c refer here to the pseudocubic and cubic perovskite cells, respectively). Suitable changes in both the substrate orientation and processing conditions allowed the growth of perovskite structured ferroelectric films with various degrees of orientation, from highly [001](pc)-oriented PYbN-PT/SRO/LAO to highly [111](pc)-oriented PYbN-PT/SRO/STO heterostructures. It was found that fatigue characteristics of such as-grown planar capacitors are strongly dependent on their crystalline orientation. In particular, [001](pc)-heteroepitaxial thin films result in fatigue-free capacitors up to 10(11) cycles, while [111](pc)-oriented heterostructures exhibit a marked degradation of the switchable polarization by ac voltage cycling. These data are consistent with recent findings of fatigue anisotropy in relaxor ferroelectric-PbTiO3 single crystals. (C) 2000 American Institute of Physics. [S0021-8979(00)05508-0].
引用
收藏
页码:3965 / 3972
页数:8
相关论文
共 34 条
  • [1] ABE K, 1995, MATER RES SOC SYMP P, V361, P465
  • [2] CONTRIBUTION OF ELECTRODES AND MICROSTRUCTURES TO THE ELECTRICAL-PROPERTIES OF PB(ZR0.53TI0.47)O-3 THIN-FILM CAPACITORS
    ALSHAREEF, HN
    KINGON, AI
    CHEN, X
    BELLUR, KR
    AUCIELLO, O
    [J]. JOURNAL OF MATERIALS RESEARCH, 1994, 9 (11) : 2968 - 2975
  • [3] AlShareef HN, 1996, APPL PHYS LETT, V68, P690, DOI 10.1063/1.116593
  • [4] FATIGUE OF FERROELECTRIC PBZRXTIYO3 CAPACITORS WITH RU AND RUOX ELECTRODES
    BERNSTEIN, SD
    WONG, TY
    KISLER, Y
    TUSTISON, RW
    [J]. JOURNAL OF MATERIALS RESEARCH, 1993, 8 (01) : 12 - 13
  • [5] Structural and electrical characterization of heteroepitaxial Pb[Yb1/2Nb1/2]O3-PbTiO3 thin films
    Bornand, V
    Trolier-McKinstry, S
    [J]. JOURNAL OF APPLIED PHYSICS, 2000, 87 (08) : 3958 - 3964
  • [6] BORNAND V, UNPUB
  • [7] BORNAND V, IN PRESS THIN SOLID
  • [8] Effect of textured LaNiO3 electrode on the fatigue improvement of Pb(Zr0.53Ti0.47)O-3 thin films
    Chen, MS
    Wu, TB
    Wu, JM
    [J]. APPLIED PHYSICS LETTERS, 1996, 68 (10) : 1430 - 1432
  • [9] Direct observation of region by region suppression of the switchable polarization (fatigue) in Pb(Zr,Ti)O3 thin film capacitors with Pt electrodes
    Colla, EL
    Hong, SB
    Taylor, DV
    Tagantsev, AK
    Setter, N
    No, K
    [J]. APPLIED PHYSICS LETTERS, 1998, 72 (21) : 2763 - 2765
  • [10] Fatigued state of the Pt-PZT-Pt system
    Colla, EL
    Tagantsev, AK
    Taylor, DV
    Kholkin, AL
    [J]. INTEGRATED FERROELECTRICS, 1997, 18 (1-4) : 19 - 28