Cryogenic sapphire oscillator with exceptionally high long-term frequency stability

被引：65

作者：

Hartnett, J. G. ^{[1
]}

Locke, C. R. ^{[1
]}

Ivanov, E. N. ^{[1
]}

Tobar, M. E. ^{[1
]}

Stanwix, P. L. ^{[1
]}

机构：

[1] Univ Western Australia, Sch Phys, Crawley, WA 6009, Australia

来源：

APPLIED PHYSICS LETTERS | 2006年 / 89卷 / 20期

基金：

澳大利亚研究理事会;

关键词：

D O I：

10.1063/1.2387969

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The authors report on the development of a sapphire cryogenic microwave resonator oscillator with long-term fractional frequency stability of 2x10(-17)root tau for integration times tau>10(3) s and a negative drift of about 2.2x10(-15)/day. The short-term frequency instability of the oscillator is highly reproducible and also state of the art: 5.6x10(-16) for an integration time of tau approximate to 20 s. (c) 2006 American Institute of Physics.

引用

页数：3

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