GaAs resistor structures for X-ray imaging detectors

被引:33
作者
Ayzenshtat, GI
Budnitsky, DL
Koretskaya, OB
Novikov, VA
Okaevich, LS
Potapov, AI
Tolbanov, OP
Tyazhev, AV [1 ]
Vorobiev, AP
机构
[1] Siberian Phys Tech Inst, Tomsk, Russia
[2] Semicond Device Res Inst, Sci & Prod State Enterprise, Tomsk, Russia
[3] Tomsk VV Kuibyshev State Univ, Tomsk 634050, Russia
[4] High Energy Phys Inst, Sci State Ctr, Protvino, Russia
关键词
GaAs; resistor structure; alpha; beta; gamma-radiation; charge collection efficiency;
D O I
10.1016/S0168-9002(02)00951-8
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 [仪器科学与技术]; 080401 [精密仪器及机械]; 081102 [检测技术与自动化装置];
摘要
Unlike conventional GaAs detector structures, which operation is based on the use of a space charge region of a barrier structure, we propose to form a detector structure of resistor type. In this case, the electric field distribution, xi(x), is not screened by the ion concentration in the SCR but it is defined only by the uniformity of the resistance value distribution in the structure. The experimental results on charge collection efficiency for the detector irradiation with a, beta, gamma-radiation are presented. It is shown that the amplitude spectrum shape in the case of interaction with gamma-radiation is defined mainly by the electron component of the charge. The simulation of the detector response function confirms it. It is established that, despite of hole trapping, it is possible to achieve high values of charge collection efficiency of gamma-radiation. Explanation of the charge collection efficiency dependence on a type of ionizing radiation is made. Problems of design of the detector with high charge collection efficiency and low dark current are discussed. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:96 / 101
页数:6
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