EFFECTS OF CARRIER TRAPPING IN SEMICONDUCTOR GAMMA-RAY SPECTROMETERS

被引：84

作者：

TRAMMELL, R

WALTER, FJ

机构：

[1] ORTEC Inc., Oak Ridge

来源：

NUCLEAR INSTRUMENTS & METHODS | 1969年 / 76卷 / 02期

关键词：

D O I：

10.1016/0029-554X(69)90034-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Currently accepted theories predicting the effects of carrier trapping on the spectrum from semiconductor gamma-ray spectrometers are reviewed. The physical models used in these theories are re-examined and a new theory is presented which predicts quite different effects. © 1969.

引用

页码：317 / +

页数：1

共 8 条

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[4] INFLUENCE OF CARRIER CAPTURE ON RESOLUTION OF SEMICONDUCTOR RADIATION COUNTERS
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[5] FURTHER CHARGE COLLECTION STUDIES IN COAXIAL GE(LI) DETECTORS
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MCMATH, TA
FRANKS, RG
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1969, NS16 (01) : 68 - +
[6] CHARGE COLLECTION IN COAXIAL GE(LI) DETECTORS
SAKAI, E
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1968, NS15 (03) : 310 - +
[7] TRAMMELL R, 1969, NASNRC1593 NAT AC SC, P221
[8] CHARGE COLLECTION EFFICIENCIES FOR LITHIUM-DRIFTED SILICON AND GERMANIUM DETECTORS IN X-RAY ENERGY REGION
ZULLIGER, HR
AITKEN, DW
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1968, NS15 (01) : 466 - &

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