Multiple-electron capture processes in 70-keV 15N7++Ar collisions:: A triple-coincidence study

被引：19

作者：

Emmons, ED ^{[1
]}

Hasan, AA ^{[1
]}

Ali, R ^{[1
]}

机构：

[1] Univ Nevada, Dept Phys, Reno, NV 89557 USA

来源：

PHYSICAL REVIEW A | 1999年 / 60卷 / 06期

关键词：

D O I：

10.1103/PhysRevA.60.4616

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Double- through quintuple-electron capture processes in the 70-keV N-15(7+) + Ar collision system have been investigated by means of time-of-flight triple-coincidence measurements of Anger electrons, scattered projectile, and target recoil ions. Subpartial Auger-electron spectra corresponding to specific pairs of final projectile and recoil-ion charge states have been obtained and discussed within the framework of the extended classical overbarrier model [A. Niehaus, J. Phys. B 19, 2925 (1986)]. By allowing for target excitation the model accounts reasonably well for the observed initial populations. Possible relaxation pathways of the populated multiply excited configurations have been identified. Measurements of this type allow a deeper understanding of the production and relaxation pathways of these configurations. [S1050-2947(99)06112-0].

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页码：4616 / 4626

页数：11

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