How polycrystalline devices can outperform single-crystal ones: Thin film CdTe/CdS solar cells

被引：152

作者：

Visoly-Fisher, I

Cohen, SR

Ruzin, A

Cahen, D ^{[1
]}

机构：

[1] Weizmann Inst Sci, IL-76100 Rehovot, Israel

[2] Tel Aviv Univ, Dept Phys Elect, IL-69978 Tel Aviv, Israel

来源：

ADVANCED MATERIALS | 2004年 / 16卷 / 11期

关键词：

D O I：

10.1002/adma.200306624

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The single-crystal outperformance of thin film polycrystalline (PX) CdTe/CdS solar cells was analyzed. The defect density of grains was reduced by gettering of defects at the grain boundaries (GB). Scanning capacitance microscopy (SCM) alongwith scanning Kelvin probe microscopy (SKPM) characterize the grain surface electrically. The results show that the separation and collection of photogenerated charge carriers was enhanced by CdTe GB.

引用

收藏

页码：879 / 883

页数：5

相关论文

共 40 条

[1] A study of the back contacts on CdTe/CdS solar cells [J].

Bätzner, DL ;

Wendt, R ;

Romeo, A ;

Zogg, H ;

Tiwari, AN .

THIN SOLID FILMS, 2000, 361 :463-467

[2]

Breitenstein O., 2001, Diffusion and Defect Data Part B (Solid State Phenomena), V78-79, P29

[3] Observation of transition metals at shunt locations in multicrystalline silicon solar cells [J].

Buonassisi, T ;

Vyvenko, OF ;

Istratov, AA ;

Weber, ER ;

Hahn, G ;

Sontag, D ;

Rakotoniaina, JP ;

Breitenstein, O ;

Isenberg, J ;

Schindler, R .

JOURNAL OF APPLIED PHYSICS, 2004, 95 (03) :1556-1561

[4] DEFECT CHEMICAL EXPLANATION FOR THE EFFECT OF AIR ANNEAL ON CDS/CULNSE2 SOLAR-CELL PERFORMANCE [J].

CAHEN, D ;

NOUFI, R .

APPLIED PHYSICS LETTERS, 1989, 54 (06) :558-560

[5] A two-dimensional modeling of the fine-grained polycrystalline silicon thin-film solar cells [J].

Christoffel, E ;

Rusu, M ;

Zerga, A ;

Bourdais, S ;

Noël, S ;

Slaoui, A .

THIN SOLID FILMS, 2002, 403 :258-262

[6] NANOMECHANICS OF A AU-IR CONTACT USING A BIDIRECTIONAL ATOMIC FORCE MICROSCOPE [J].

COHEN, SR ;

NEUBAUER, G ;

MCCLELLAND, GM .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04) :3449-3454

[7] Status and review of two-dimensional carrier and dopant profiling using scanning probe microscopy [J].

De Wolf, P ;

Stephenson, R ;

Trenkler, T ;

Clarysse, T ;

Hantschel, T ;

Vandevorst, W .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (01) :361-368

[8] Materials aspects of CdTe/CdS solar cells [J].

Durose, K ;

Edwards, PR ;

Halliday, DP .

JOURNAL OF CRYSTAL GROWTH, 1999, 197 (03) :733-742

[9] Simulation and correction of geometric distortions in scanning Kelvin probe microscopy [J].

Efimov, A ;

Cohen, SR .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 2000, 18 (04) :1051-1055

[10]

Fahrenbruch A. L., 1983, FUNDAMENTALS SOLAR C

← 1 2 3 4 →