Force-distance curves by AFM - A powerful technique for studying surface interactions

被引：72

作者：

Capella, B

Baschieri, P

Frediani, C

Miccoli, P

Ascoli, C

机构：

来源：

IEEE ENGINEERING IN MEDICINE AND BIOLOGY MAGAZINE | 1997年 / 16卷 / 02期

关键词：

D O I：

10.1109/51.582177

中图分类号：

R318 [生物医学工程];

学科分类号：

0831 ;

摘要：

引用

页码：58 / 65

页数：8

共 41 条

[1] IMAGING SPECTROSCOPY WITH THE ATOMIC-FORCE MICROSCOPE [J].

BASELT, DR ;

BALDESCHWIELER, JD .

JOURNAL OF APPLIED PHYSICS, 1994, 76 (01) :33-38

[2] INTERACTION FORCES OF A SHARP TUNGSTEN TIP WITH MOLECULAR FILMS ON SILICON SURFACES [J].

BLACKMAN, GS ;

MATE, CM ;

PHILPOTT, MR .

PHYSICAL REVIEW LETTERS, 1990, 65 (18) :2270-2273

[3] INTERPRETATION ISSUES IN FORCE MICROSCOPY [J].

BURNHAM, NA ;

COLTON, RJ ;

POLLOCK, HM .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (04) :2548-2556

[4] PROBING THE SURFACE FORCES OF MONOLAYER FILMS WITH AN ATOMIC-FORCE MICROSCOPE [J].

BURNHAM, NA ;

DOMINGUEZ, DD ;

MOWERY, RL ;

COLTON, RJ .

PHYSICAL REVIEW LETTERS, 1990, 64 (16) :1931-1934

[5] ELECTROSTATIC INTERACTION IN ATOMIC FORCE MICROSCOPY [J].

BUTT, HJ .

BIOPHYSICAL JOURNAL, 1991, 60 (04) :777-785

[6] MEASURING ELECTROSTATIC, VANDERWAALS, AND HYDRATION FORCES IN ELECTROLYTE-SOLUTIONS WITH AN ATOMIC FORCE MICROSCOPE [J].

BUTT, HJ .

BIOPHYSICAL JOURNAL, 1991, 60 (06) :1438-1444

[7]

CAPPELLA B, UNPUB NANOTECHNOLOGY

[8] ATOMIC RESOLUTION IMAGES OF METALLIC MATERIALS IN OIL [J].

ENDO, T ;

YAMADA, H ;

SUMOMOGI, T ;

KUWAHARA, K ;

MORITA, S .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02) :837-840

[9] ADHESION FORCES BETWEEN INDIVIDUAL LIGAND-RECEPTOR PAIRS [J].

FLORIN, EL ;

MOY, VT ;

GAUB, HE .

SCIENCE, 1994, 264 (5157) :415-417

[10] ELECTROSTATIC AND CONTACT FORCES IN FORCE MICROSCOPY [J].

HAO, HW ;

BARO, AM ;

SAENZ, JJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02) :1323-1328

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