Normal and lateral modulation with a scanning force microscope, an analysis: implication in quantitative elastic and friction imaging

被引：61

作者：

Mazeran, PE ^{[1
]}

Loubet, JL ^{[1
]}

机构：

[1] Ecole Cent Lyon, CNRS, UMR 5513, Lab Tribol & Dynam Syst, F-69131 Ecully, France

来源：

TRIBOLOGY LETTERS | 1999年 / 7卷 / 04期

关键词：

scanning force microscope; lateral force microscope; force modulation; normal and lateral modulation; elasticity; friction; contact stiffness; Young modulus; shear modulus; modeling;

D O I：

10.1023/A:1019142025011

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

Results and an analysis are presented on elastic and friction imaging by indirect force modulation with a scanning force microscope. Two techniques are compared, normal modulation (Z-modulation, perpendicular to the surface of the sample) and lateral modulation of the contact (X-modulation in the plane of the sample, perpendicular to the axis of the cantilever). Theoretical and experimental results show that lateral modulation offers great advantages compared to normal modulation: the images are free of artifacts and can be easily quantified.

引用

页码：199 / 212

页数：14

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