Density, stress, hardness and reduced Young's modulus of W-C:H coatings

被引:18
作者
Pujada, B. R.
Janssen, G. C. A. M.
机构
[1] Netherlands Inst Met Res, NL-2600 GA Delft, Netherlands
[2] Delft Univ Technol, Dept Mat Sci & Engn, NL-2628 CD Delft, Netherlands
关键词
sputter deposition; diamond-like carbon coatings; compressive stress;
D O I
10.1016/j.surfcoat.2006.08.058
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Density, hardness and compressive stress of tungsten contained in an amorphous-hydrogenated-carbon matrix (W-C:H) have been studied as a function of composition and bias voltage. W-C:H coatings were deposited by reactive sputter deposition from a tungsten-carbide (WC target on silicon substrate in an argon-acetylene plasma. W-C:H coatings obtained at different acetylene flow rates and substrate bias voltages, were characterized by scanning electron microscopy, X-ray diffraction, nanoindentation and substrate curvature method. It has been observed that compressive stress, hardness and reduced Young's modulus decrease when the acetylene flow is increased from 0 to 10 seem. Also, compressive stress and hardness increases with the substrate bias voltage. In particular, for W-C:H coatings obtained at 5 seem of acetylene flow, the compressive stress and hardness increase from - 1.6 GPa to - 3.2 GPa and from 19 GPa to 24 GPa, respectively, when increasing the substrate bias from 0 to 200 V. The variation of the internal stress, hardness and density of the coatings is discussed in terms of composition and structure of the W-C:H coatings. (c) 2006 Elsevier B.V All rights reserved.
引用
收藏
页码:4284 / 4288
页数:5
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