Design for thermal testability (DfTT) and a CMOS realization

被引：5

作者：

Szekely, V ^{[1
]}

Marta, C ^{[1
]}

Rencz, M ^{[1
]}

Benedek, Z ^{[1
]}

Courtois, B ^{[1
]}

机构：

[1] TIMA LAB,F-38031 GRENOBLE,FRANCE

来源：

SENSORS AND ACTUATORS A-PHYSICAL | 1996年 / 55卷 / 01期

关键词：

designs for thermal testability; thermal testing;

D O I：

10.1016/S0924-4247(96)01246-0

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The paper presents the idea of design for thermal testability (DfTT) of electronic or microelectromechanical systems (MEMS). The suggested method enables both on-line and off-line thermal monitoring of systems provided with DfTT circuitry. A CMOS-compatible digital-output temperature sensor, the key element of the required circuitry, is presented with experimental results. Sensor placement and result readout strategies are discussed and evaluated.

引用

页码：29 / 33

页数：5

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