Lattice strain and lattice expansion of the SrRuO3 layers in SrRuO3/PbZr0.52Ti0.48O3/SrRuO3 multilayer thin films

被引:31
作者
Jia, CL [1 ]
Contreras, JR [1 ]
Poppe, U [1 ]
Kohlstedt, H [1 ]
Waser, R [1 ]
Urban, K [1 ]
机构
[1] Forschungszentrum Julich, Inst Festkorperforsch, D-52425 Julich, Germany
关键词
D O I
10.1063/1.1483369
中图分类号
O59 [应用物理学];
学科分类号
摘要
In SrRuO3/PbZr0.52Ti0.48O3/SrRuO3 multilayer thin films on SrTiO3 substrates the different lattice distortion behavior of the top and the bottom SrRuO3 film layer is found and characterized by means of transmission electron microscopy. The bottom SrRuO3 layer is compressively strained in the film plane by a constraint of the SrTiO3 substrate. In contrast, in the interface area of the top SrRuO3 layer, a lattice dilatation is measured not only in the film plane but also parallel to the film normal. The misfit strain, the lead interdiffusion and the oxygen concentration in this area are investigated and discussed as possible reasons for the unexpected lattice dilatation along the film normal direction. (C) 2002 American Institute of Physics.
引用
收藏
页码:101 / 105
页数:5
相关论文
共 24 条
[1]   LAXSR1-XRUO3 - NEW PEROVSKITE SERIES [J].
BOUCHARD, RJ ;
WEIHER, JF .
JOURNAL OF SOLID STATE CHEMISTRY, 1972, 4 (01) :80-&
[2]   Itinerant-to-localized electron transition in CaRu1-xSrxO3 and SrRu1-xPbxO3 [J].
Cao, G ;
McCall, S ;
Bolivar, J ;
Shepard, M ;
Freibert, F ;
Henning, P ;
Crow, JE ;
Yuen, T .
PHYSICAL REVIEW B, 1996, 54 (21) :15144-15148
[3]   Epitaxial SrRuO3 thin films on (001) SrTiO3 [J].
Chen, CL ;
Cao, Y ;
Huang, ZJ ;
Jiang, QD ;
Zhang, Z ;
Sun, YY ;
Kang, WN ;
Dezaneti, LM ;
Chu, WK ;
Chu, CW .
APPLIED PHYSICS LETTERS, 1997, 71 (08) :1047-1049
[4]   OBSERVATION OF 2 CHARGE STATES OF RUTHENIUM IN PBTIO3 SINGLE-CRYSTALS [J].
CLEM, PG ;
PAYNE, DA ;
WARREN, WL .
JOURNAL OF APPLIED PHYSICS, 1995, 77 (11) :5865-5868
[5]  
CONTRERAS JR, 2001, IN PRESS MRS FALL M
[6]   FABRICATION AND PROPERTIES OF EPITAXIAL FERROELECTRIC HETEROSTRUCTURES WITH (SRRUO3) ISOTROPIC METALLIC OXIDE ELECTRODES [J].
EOM, CB ;
VANDOVER, RB ;
PHILLIPS, JM ;
WERDER, DJ ;
MARSHALL, JH ;
CHEN, CH ;
CAVA, RJ ;
FLEMING, RM ;
FORK, DK .
APPLIED PHYSICS LETTERS, 1993, 63 (18) :2570-2572
[7]  
EOM CB, 1993, SCIENCE, V258, P1776
[8]   Microstructure and residual strain in La2CuO4 thin films on LaSrAlO4-buffered SrTiO3 substrates -: art. no. 075416 [J].
Jia, CL ;
Zeng, XH ;
Xi, XX ;
Urban, K .
PHYSICAL REVIEW B, 2001, 64 (07)
[9]   Pulsed laser deposition of conductive SrRuO3 thin films [J].
Jia, QX ;
Foltyn, SR ;
Hawley, M ;
Wu, XD .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1997, 15 (03) :1080-1083
[10]   THE STRUCTURE OF SRRUO3 BY TIME-OF-FLIGHT NEUTRON POWDER DIFFRACTION [J].
JONES, CW ;
BATTLE, PD ;
LIGHTFOOT, P ;
HARRISON, WTA .
ACTA CRYSTALLOGRAPHICA SECTION C-CRYSTAL STRUCTURE COMMUNICATIONS, 1989, 45 :365-367