Investigation of diamond-like carbon films synthesized by multi-jet hollow cathode rf plasma source

被引:19
作者
Fedosenko, G
Korzec, D
Engemann, J
Lyebyedyev, D
Scheer, HC
机构
[1] Berg Univ Wuppertal, Forschungszentrum Mikrostrukturtech, D-42287 Wuppertal, Germany
[2] Berg Univ Wuppertal, Fachbereich Elektr & Informat Tech, D-42119 Wuppertal, Germany
关键词
chemical vapor deposition; Raman scattering; ellipsometry; optical properties;
D O I
10.1016/S0040-6090(01)01768-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Diamond-like carbon films were prepared by use of a hollow cathode discharge plasma source (HCD), operating at 13.56 MHz. At a distance of 6 cm from the plasma source, a water-cooled substrate holder was positioned, which was biased at 13.56 MHz as well. A plasma-enhanced chemical vapor deposition (PECVD) process was used. Helium as a carrier gas and methane as a source of carbon were used for diamond-like carbon (DLC) film deposition. DLC films were characterized with a micro Raman spectroscopy and spectroscopic ellipsometry. In the wavelength range of 300-900 nm the measured spectra were analyzed by a regression-fitting algorithm, according to the nominal sample structure in which the optical properties of DLC were described by a Cauchy dispersion model. Optimum film quality was obtained in a bias voltage range, between -(350-420) V, which produces the films with the highest index of refraction, close to 2.15; a wavelength of 550 nm; lowest optical band gap close to 1.3 eV and a Vickers hardness of 30 GPa. It was found that, even in the stationary deposition, mode film thickness variations across a 5-inch wafer did not exceed +/-3.5%. A maximum deposition rate of 70-80 nm/min at room temperature was achieved. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:275 / 281
页数:7
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