Mode control in vertical-cavity surface-emitting lasers by post-processing using focused ion-beam etching

被引：23

作者：

Dowd, P

Raddatz, L

Sumaila, Y

Asghari, M

White, IH

Heard, PJ

Allen, GC

Schneider, RP

Tan, MRT

Wang, SY

机构：

[1] UNIV BRISTOL,INTERFACE ANAL CTR,BRISTOL BS2 8BS,AVON,ENGLAND

[2] HEWLETT PACKARD LABS,PALO ALTO,CA 94303

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 1997年 / 9卷 / 09期

基金：

英国工程与自然科学研究理事会;

关键词：

focused ion-beam etching; reflectivity engineering; transverse mode control; vertical-cavity surface-emitting lasers;

D O I：

10.1109/68.618474

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Single-mode emission is achieved in previously multimode gain-guided vertical-cavity surface-emitting lasers (VCSEL's) by localized modification of the mirror reflectivity using focused ion-beam etching. Reflectivity engineering is also demonstrated to suppress transverse mode emission in an oxide-confined device, reducing the spectral width from 1.2 nm to less than 0.5 nm.

引用

收藏

页码：1193 / 1195

页数：3

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