Molecular-scale non-contact AFM studies of ferroelectric organic thin films epitaxially grown on alkali halides

被引：19

作者：

Fukuma, T ^{[1
]}

Kobayashi, K

Noda, K

Ishida, K

Horiuchi, T

Yamada, H

Matsushige, K

机构：

[1] Kyoto Univ, Dept Elect Sci & Engn, Sakyo Ku, Kyoto 6068501, Japan

[2] Kyoto Univ, Int Innovat Ctr, Sakyo Ku, Kyoto 6068501, Japan

来源：

SURFACE SCIENCE | 2002年 / 516卷 / 1-2期

基金：

日本学术振兴会;

关键词：

atomic force microscopy; epitaxy; surface structure; morphology; roughness; and topography; alkali halides; insulating surfaces;

D O I：

10.1016/S0039-6028(02)01876-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Epitaxially grown vinylidene fluoride oligomer thin films formed on KCl(0 0 1) surfaces were investigated by ultrahigh vacuum non-contact AFM (UHV-NC-AFM). Molecularly resolved NC-AFM images of organic thin layers on insulating surfaces were successfully obtained for the first time, which revealed the epitaxial growth process on a molecular-scale. It was found that the first monolayer formed on KCl(0 0 1) surface was composed of characteristic honeycomb-like structures while the following upper molecular layers consist of molecular-scale stripe structures. In addition, NC-AFM images of the first monolayer suggest a strong electrostatic interaction between the molecule in the layer and the AFM probe tip. © 2002 Published by Elsevier Science B.V.

引用

页码：103 / 108

页数：6

共 18 条

[1] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].