High frequency magnetization response observed at the air-bearing surfaces of thin film heads

被引:6
作者
Liu, FH
Tong, HC
Milosvlasky, L
机构
[1] Read-Rite Corporation, Fremont, CA 94539
关键词
D O I
10.1109/20.538682
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Magnetization response during high frequency and high amplitude write current excitations at the air-bearing surfaces (ABS) of thin film inductive and MR write heads were observed by using a Scanning Kerr Effect Microscope, Under certain excitation conditions, bubble-like dynamic domain walls that separate the regions of 180 degrees out-of-phase magnetization reversals were observed predominately at the ABS of trailing poles (P2). This magnetization reversal mechanism is believed to be introduced by the combined effects of eddy current damping and local magnetization saturation, and is consistent with the model proposed by Wood and Williams.
引用
收藏
页码:3536 / 3538
页数:3
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