Enhanced stability of organic light-emitting devices fabricated under ultra-high vacuum condition

被引:44
作者
Ikeda, Takeshi
Murata, Hideyuki
Kinoshita, Yoshiki
Shike, Junichi
Ikeda, Yoshikazu
Kitano, Masahiro
机构
[1] Japan Adv Inst Sci & Technol, Sch Mat Sci, Nomi, Ishikawa 9231292, Japan
[2] Japan Sci & Technol Agcy, PRESTO, Kawaguchi, Saitama 3320012, Japan
[3] Kitamo Seiki Co Ltd, Tokyo 1430024, Japan
关键词
D O I
10.1016/j.cplett.2006.06.002
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Studies on the intrinsic degradation of organic light-emitting devices (OLEDs) based on tris(8-hydroxyquinolinolato)aluminum (III) (Alq(3)) revealed that the operation stability of the OLEDs depends on the process pressure during device fabrication. Lowering of the pressure resulted in stable devices. In sharp contrast, differences in the initial device characteristics were marginal in all devices. Analyses with a quadrupole mass spectrometer indicated that the primary difference in the pressure during device fabrication was attributable to the amount of residual water. The results show that the degradation of OLEDs is associated with the electrochemical reaction of Alq(3) with water. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:111 / 114
页数:4
相关论文
共 11 条
[1]   Degradation mechanism of small molecule-based organic light-emitting devices [J].
Aziz, H ;
Popovic, ZD ;
Hu, NX ;
Hor, AM ;
Xu, G .
SCIENCE, 1999, 283 (5409) :1900-1902
[2]   Humidity-induced crystallization of tris (8-hydroxyquinoline) aluminum layers in organic light-emitting devices [J].
Aziz, H ;
Popovic, Z ;
Xie, S ;
Hor, AM ;
Hu, NX ;
Tripp, C ;
Xu, G .
APPLIED PHYSICS LETTERS, 1998, 72 (07) :756-758
[3]   Relationship between electroluminescence and current transport in organic heterojunction light-emitting devices [J].
Burrows, PE ;
Shen, Z ;
Bulovic, V ;
McCarty, DM ;
Forrest, SR ;
Cronin, JA ;
Thompson, ME .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (10) :7991-8006
[4]  
Halliday B. S., 1998, BASIC VACUUM TECHNOL
[5]  
HUNG LS, 1997, APPL PHYS LETT, V70, P52
[6]   Observation of the Mott-Gurney law in tris (8-hydroxyquinoline) aluminum films [J].
Kiy, M ;
Losio, P ;
Biaggio, I ;
Koehler, M ;
Tapponnier, A ;
Günter, P .
APPLIED PHYSICS LETTERS, 2002, 80 (07) :1198-1200
[7]   Nonradiative recombination centers and electrical aging of organic light-emitting diodes: Direct connection between accumulation of trapped charge and luminance loss [J].
Kondakov, DY ;
Sandifer, JR ;
Tang, CW ;
Young, RH .
JOURNAL OF APPLIED PHYSICS, 2003, 93 (02) :1108-1119
[8]   Metal diffusion from electrodes in organic light-emitting diodes [J].
Lee, ST ;
Gao, ZQ ;
Hung, LS .
APPLIED PHYSICS LETTERS, 1999, 75 (10) :1404-1406
[9]   A chemical failure mechanism for aluminum(III) 8-hydroxyquinoline light-emitting devices [J].
Papadimitrakopoulos, F ;
Zhang, XM ;
Thomsen, DL ;
Higginson, KA .
CHEMISTRY OF MATERIALS, 1996, 8 (07) :1363-&
[10]   ORGANIC ELECTROLUMINESCENT DIODES [J].
TANG, CW ;
VANSLYKE, SA .
APPLIED PHYSICS LETTERS, 1987, 51 (12) :913-915