Fluorescence spectroscopy and transmission electron microscopy of the same isolated semiconductor nanocrystals

被引：28

作者：

Koberling, F

Mews, A ^{[1
]}

Philipp, G

Kolb, U

Potapova, I

Burghard, M

Basché, T

机构：

[1] Univ Mainz, Inst Phys Chem, D-55099 Mainz, Germany

[2] Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany

来源：

APPLIED PHYSICS LETTERS | 2002年 / 81卷 / 06期

关键词：

D O I：

10.1063/1.1499221

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present a method to establish a correlation between the crystalline structure and the fluorescence properties of isolated semiconductor nanocrystals. By using ultrathin silicon nitride substrates with markers, we have localized and investigated the same particles in both a high-resolution transmission electron microscope (TEM) and a confocal optical microscope. We have found that the observation of strong fluorescence emission does not require single domain particles. Additionally, we have correlated the size and shape of a particle as determined by TEM and its spectral properties like emission wavelength and spectral diffusion. (C) 2002 American Institute of Physics.

引用

页码：1116 / 1118

页数：3

共 20 条

[1] (CdSe)ZnS core-shell quantum dots: Synthesis and characterization of a size series of highly luminescent nanocrystallites [J].