Rapid elemental analysis of sediment samples by isotope source XRF

被引:114
作者
Boyle, JF [1 ]
机构
[1] Univ Liverpool, Dept Geog, Liverpool L69 3BX, Merseyside, England
关键词
geochemistry; heavy metals; palaeolimnology; sediment; soil; X-ray fluorescence;
D O I
10.1023/A:1008053503694
中图分类号
X [环境科学、安全科学];
学科分类号
08 [工学]; 0830 [环境科学与工程];
摘要
Energy dispersive isotope-source X-ray fluorescence (XRF) analysers are little used in academic environmental research, in spite of being ideally suited to a number of tasks. In this paper an XRF method is tested by measuring a wide range of environmental materials of known elemental composition. Precision, accuracy and detection limits are presented. Using isotope-source X-ray fluorescence analysis, the total concentrations of Si, Ti, Ca, K, Fe, Mn, Cl, S, Nb, Ni, Pb, Rb, Sr, Zn and Zr can be determined in soils and sediments at a rate of > 70 samples per day. The combination of speed and accuracy makes the technique ideal for three classes of application within environmental research. First, in sediments and soils that are highly heterogeneous, reliable characterisation is more dependent upon the number of samples measured than on measurement precision or accuracy. Under these circumstances the method is sufficiently accurate to be used alone. This is also the case where there is high and wide ranging contamination of sediment or soil by Pb and Zn. Second, major elements (Si, Ti, Fe, Ca, K and S) can be measured with sufficient accuracy in sediments and soils to aid the interpretation of other sediment chemical analyses. Third, the technique is ideal for the rapid screening of sediment or soil, allowing effective targeting of samples for more time consuming or expensive analyses. The XRF method presented here offers rapid, non-destructive total elemental analysis of sediments and soils that is sufficiently accurate to be useful in environmental research.
引用
收藏
页码:213 / 221
页数:9
相关论文
共 14 条
[1]
BOYLE JF, 1998, IN PRESS XRAY SP DEC
[2]
Couture RA, 1996, AM MINERAL, V81, P639
[3]
ENGSTROM DR, 1984, CHEM STRATIGRAPHY LA
[4]
FIGURA PM, 1993, AM LAB, V25, P40
[5]
ENERGY DISPERSIVE-X-RAY FLUORESCENCE SPECTROMETRY FOR DETERMINATION OF 26 TRACE AND 2 MAJOR ELEMENTS IN GEOCHEMICAL SPECIMENS [J].
GIAUQUE, RD ;
GARRETT, RB ;
GODA, LY .
ANALYTICAL CHEMISTRY, 1977, 49 (01) :62-67
[6]
TRACE-ELEMENT DETERMINATION WITH SEMICONDUCTOR DETECTOR X-RAY SPECTROMETERS [J].
GIAUQUE, RD ;
GOULDING, FS ;
JAKLEVIC, JM ;
PEHL, RH .
ANALYTICAL CHEMISTRY, 1973, 45 (04) :671-681
[7]
X-RAY-FLUORESCENCE DETERMINATION OF TRACE-ELEMENTS IN GEOLOGICAL-MATERIALS - AN ITERATIVE APPROACH TO COMPTON SCATTER CORRECTIONS FOR MATRIX ABSORPTION [J].
HARVEY, PK .
X-RAY SPECTROMETRY, 1992, 21 (01) :3-9
[8]
SIMULTANEOUS MATRIX AND BACKGROUND CORRECTION METHOD AND ITS APPLICATION IN XRF CONCENTRATION DETERMINATION OF TRACE-ELEMENTS IN GEOLOGICAL-MATERIALS [J].
HUA, YN .
X-RAY SPECTROMETRY, 1994, 23 (01) :27-31
[9]
AN ACCURATE X-RAY SPECTROGRAPHIC METHOD FOR ANALYSIS OF A WIDE RANGE OF GEOLOGICAL SAMPLES [J].
NORRISH, K ;
HUTTON, JT .
GEOCHIMICA ET COSMOCHIMICA ACTA, 1969, 33 (04) :431-&
[10]
APPLICATION OF A MICROPROCESSOR-BASED PORTABLE XRF ANALYZER IN MINERALS ANALYSIS [J].
RHODES, JR ;
RAUTALA, P .
INTERNATIONAL JOURNAL OF APPLIED RADIATION AND ISOTOPES, 1983, 34 (01) :333-343