Ferroelectric switching dynamics in VDF-TrFE copolymer thin films spin coated on Si substrate

被引:42
作者
Furukawa, T. [1 ]
Kanai, S. [1 ]
Okada, A. [1 ]
Takahashi, Y. [1 ]
Yamamoto, R. [2 ]
机构
[1] Tokyo Univ Sci, Fac Sci, Shinjuku Ku, Tokyo 1628601, Japan
[2] Gunma Ind Technol Ctr, Maebashi, Gunma 3792147, Japan
基金
日本学术振兴会;
关键词
dielectric hysteresis; dielectric polarisation; ferroelectric capacitors; ferroelectric switching; ferroelectric thin films; gold; MFIS structures; minority carriers; polymer blends; polymer films; silicon; spin coating; MEMORY; BEHAVIOR; GATE;
D O I
10.1063/1.3055411
中图分类号
O59 [应用物理学];
学科分类号
摘要
Simultaneous measurements of the charge Q and the capacitance C were performed for an MFS capacitor with Au-(vinylidene fluoride-trifluoroethylene copolymer)-(n-Si) structure using a double-frequency voltage consisting of a low-frequency high voltage and a high-frequency sinusoidal low voltage. The use of a triangular high voltage yields asymmetrical Q-V and C-V hysteresis loops that support the full ferroelectric polarization reversal occurring in close relation to charge compensation in the n-Si layer. The use of a rectangular high voltage reveals the details of asymmetric switching dynamics. Polarization switching toward the positive side starts with the loss of the depletion layer and progresses rapidly owing to the accumulation of majority carriers to be completed at a time analogous to that for the case of a metal-ferroelectric-metal capacitor. On the other hand, that toward the negative side is markedly impeded by depletion layer formation but is eventually completed via a constant-current process at a time given by the ratio of switched polarization and constant current. On the basis of a linear relationship between the constant current and the depletion layer width, we conclude that the switching dynamics under a negative voltage is controlled by the rate of minority carrier generation in the depletion layer.
引用
收藏
页数:7
相关论文
共 17 条
[1]   OPTO-FERROELECTRIC MEMORIES USING VINYLIDENE FLUORIDE AND TRIFLUORETHYLENE COPOLYMERS [J].
DATE, M ;
FURUKAWA, T ;
YAMAGUCHI, T ;
KOJIMA, A ;
SHIBATA, I .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1989, 24 (03) :537-540
[2]   Excellent ferro electricity of thin poly(vinylidene fluoride-trifluoro ethylene) copolymer films and low voltage operation of capacitors and diodes [J].
Fujisaki, Sumiko ;
Fujisaki, Yoshihisa ;
Ishiwara, Hiroshi .
IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 2007, 54 (12) :2592-2594
[3]   MEASUREMENTS OF NONLINEAR DIELECTRICITY IN FERROELECTRIC POLYMERS [J].
FURUKAWA, T ;
NAKAJIMA, K ;
KOIZUMI, T ;
DATE, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1987, 26 (07) :1039-1045
[4]  
Furukawa T, 2002, MATER RES SOC SYMP P, V698, P71
[5]   FERROELECTRIC PROPERTIES OF VINYLIDENE FLUORIDE COPOLYMERS [J].
FURUKAWA, T .
PHASE TRANSITIONS, 1989, 18 (3-4) :143-211
[6]   NANOSECOND SWITCHING IN THIN FILMS OF VINYLIDENE FLUORIDE TRIFLUOROETHYLENE COPOLYMERS [J].
FURUKAWA, T ;
MATSUZAKI, H ;
SHIINA, M ;
TAJITSU, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1985, 24 (08) :L661-L662
[7]   POLARIZATION BEHAVIOR IN VINYLIDENE FLUORIDE-TRIFLUOROETHYLENE COPOLYMER THIN-FILMS [J].
KIMURA, K ;
OHIGASHI, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1986, 25 (03) :383-387
[8]   Electrical properties of metal-ferroelectric-insulator-semiconductor structures based on ferroelectric polyvinylidene fluoride copolymer film gate for nonvolatile random access memory application [J].
Lim, SH ;
Rastogi, AC ;
Desu, SB .
JOURNAL OF APPLIED PHYSICS, 2004, 96 (10) :5673-5682
[9]   Origin of the drain current bistability in polymer ferroelectric field-effect transistors [J].
Naber, R. C. G. ;
Massolt, J. ;
Spijkman, M. ;
Asadi, K. ;
Blom, P. W. M. ;
de Leeuw, D. M. .
APPLIED PHYSICS LETTERS, 2007, 90 (11)
[10]   Low-voltage polymer field-effect transistors for nonvolatile memories [J].
Naber, RCG ;
de Boer, B ;
Blom, PWM ;
de Leeuw, DM .
APPLIED PHYSICS LETTERS, 2005, 87 (20) :1-3