Examination of the relationship between phase shift and energy dissipation in tapping mode atomic force microscopy by frequency-sweep and force-probe measurements

被引:42
作者
Bar, G
Brandsch, R
Bruch, M
Delineau, L
Whangbo, MH
机构
[1] Univ Freiburg, Freiburger Mat Forschungszentrum, D-79104 Freiburg, Germany
[2] Univ Freiburg, Inst Makromol Chem, D-79104 Freiburg, Germany
[3] N Carolina State Univ, Dept Chem, Raleigh, NC 27695 USA
关键词
energy dissipation; PDMS; phase imaging; phase shift; tapping mode atomic force microscopy;
D O I
10.1016/S0039-6028(99)00975-9
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The relationship between phase shift and energy dissipation in tapping mode atomic force microscopy was examined by performing frequency-sweep and force-probe experiments on polydimethylsiloxane (PDMS) samples of different cross-link densities. Phase shift is related to the reduced tip-sample energy dissipation, i.e. the fraction of the maximum energy of a tapping cantilever that is dissipated by the tip-sample interaction. The reduced tip-sample energy dissipation varies linearly with phase shift, and increases continuously as the tip-sample interaction increases. On a compliant polymer such as PDMS the tip-sample interaction dissipates only a small fraction of the power delivered to the tapping cantilever even under hard tapping conditions, so that the vibration of the tapping cantilever is well described in terms of the harmonic approximation. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:L11 / L16
页数:6
相关论文
共 19 条
  • [1] IMAGING OF SINGLE POLYMER-CHAINS BASED ON THEIR ELASTICITY
    AKARI, SO
    VANDERVEGTE, EW
    GRIM, PCM
    BELDER, GF
    KOUTSOS, V
    TENBRINKE, G
    HADZIIOANNOU, G
    [J]. APPLIED PHYSICS LETTERS, 1994, 65 (15) : 1915 - 1917
  • [2] Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects
    Anczykowski, B
    Kruger, D
    Fuchs, H
    [J]. PHYSICAL REVIEW B, 1996, 53 (23): : 15485 - 15488
  • [3] Basic properties of dynamic force spectroscopy with the scanning force microscope in experiment and simulation
    Anczykowski, B
    Kruger, D
    Babcock, KL
    Fuchs, H
    [J]. ULTRAMICROSCOPY, 1996, 66 (3-4) : 251 - 259
  • [4] Effect of viscoelastic properties of polymers on the phase shift in tapping mode atomic force microscopy
    Bar, G
    Brandsch, R
    Whangbo, MH
    [J]. LANGMUIR, 1998, 14 (26) : 7343 - 7348
  • [5] Effect of tip sharpness on the relative contributions of attractive and repulsive forces in the phase imaging of tapping mode atomic force microscopy
    Bar, G
    Brandsch, R
    Whangbo, MH
    [J]. SURFACE SCIENCE, 1999, 422 (1-3) : L192 - L199
  • [6] BAR G, 1999, IN PRESS APPL PHYS L
  • [7] How does a tip tap?
    Burnham, NA
    Behrend, OP
    Oulevey, F
    Gremaud, G
    Gallo, PJ
    Gourdon, D
    Dupas, E
    Kulik, AJ
    Pollock, HM
    Briggs, GAD
    [J]. NANOTECHNOLOGY, 1997, 8 (02) : 67 - 75
  • [8] NUMERICAL SIMULATIONS OF A SCANNING FORCE MICROSCOPE WITH A LARGE-AMPLITUDE VIBRATING CANTILEVER
    CHEN, J
    WORKMAN, RK
    SARID, D
    HOPER, R
    [J]. NANOTECHNOLOGY, 1994, 5 (04) : 199 - 204
  • [9] Interpretation of tapping mode atomic force microscopy data using amplitude-phase-distance measurements
    Chen, X
    Davies, MC
    Roberts, CJ
    Tendler, SJB
    Williams, PM
    Davies, J
    Dawkes, AC
    Edwards, JC
    [J]. ULTRAMICROSCOPY, 1998, 75 (03) : 171 - 181
  • [10] Energy dissipation in tapping-mode atomic force microscopy
    Cleveland, JP
    Anczykowski, B
    Schmid, AE
    Elings, VB
    [J]. APPLIED PHYSICS LETTERS, 1998, 72 (20) : 2613 - 2615