Novel transparent conductive indium zinc oxide thin films with unique properties

被引:13
作者
Takatsuji, H [1 ]
Tsuji, S
Kuroda, K
Saka, H
机构
[1] IBM Japan Ltd, Display Business Unit, Yamato 2428502, Japan
[2] Nagoya Univ, Dept Quantum Engn, Nagoya, Aichi 4648603, Japan
来源
MATERIALS TRANSACTIONS JIM | 1999年 / 40卷 / 09期
关键词
indium zinc oxide; thin-film-transistor liquid-crystal display; time-of-flight secondary ion mass spectrometry; transparent conductive material; transmission electron microscopy;
D O I
10.2320/matertrans1989.40.899
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Indium zinc oxide (IZO) thin films sputter-deposited on glass substrate were investigated for use as pixel electrodes of thin-him-transistor liquid-crystal display (TFT-LCD) applications. The experiments revealed that IZO thin film is suitable for use in high-performance TFT-LCDs with respect to its electrical and optical properties, and its etching performance. Cross-sectional transmission electron microscopy (TEM) and X-ray diffraction (XRD) analyses indicated hat the IZO film remains in an amorphous state after annealing in vacuum or in an N-2-added atmosphere, but that its electrical and optical properties are changed by annealing in an Nz-added atmosphere. After the latter treatment, the film's resistivity increased to about 3 times that of an IZO film annealed in vacuum; however, we found a novel transparent conductive thin film, which has over 90% transparency within the infrared range (800-3200 nm) and a resistivity of about 1.2 m Omega cm. Depth profile analysis using time-of-flight secondary ion mass spectrometry (TOF-SIMS) revealed a difference of chemical structure in the two films after annealing under different conditions.
引用
收藏
页码:899 / 902
页数:4
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