GaAsSb: A novel material for near infrared photodetectors on GaAs substrates

被引:47
作者
Sun, XG [1 ]
Wang, SL [1 ]
Hsu, JS [1 ]
Sidhu, R [1 ]
Zheng, XGG [1 ]
Li, XW [1 ]
Campbell, JC [1 ]
Holmes, AL [1 ]
机构
[1] Univ Texas, Microelect Res Ctr, Dept Elect & Comp Engn, Austin, TX 78712 USA
基金
美国国家科学基金会;
关键词
photodetectors; photodiodes; photoluminescence; quantum wells;
D O I
10.1109/JSTQE.2002.800848
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have studied the molecular beam epitaxy (MBE) growth of GaAsSb on GaAs substrates. The optical properties and composition of GaAsSb layer strongly depend on the growth temperature, the Ga growth rate, and the As and Sb fluxes and their ratios. We also report on two GaAsSb-GaAs photodiode structures operating at 1.3 mum. The peak quantum efficiency was 54% for the GaAsSb resonant-cavity-enhanced (RCE) p-i-n photodiode and 36% for the RCE GaAsSb avalanche photodiode (APD) with separate absorption, charge, and multiplication regions (SACM). At 90% of the breakdown, the dark current of the SACM APD was 5 nA. The GaAsSb SACM APD also exhibited very low multiplication noise and k(eff) was approximately 0.1, which is the lowest ever reported for APDs operating at 1.3 mum.
引用
收藏
页码:817 / 822
页数:6
相关论文
共 17 条
[11]  
SUN X, IN PRESS IEEE PHOTON
[12]  
SUN X, IN PRESS APPL PHYS L
[13]   Low-noise avalanche photodiodes with graded impact-lonization-engineered multiplication region [J].
Wang, S ;
Sidhu, R ;
Zheng, XG ;
Li, X ;
Sun, X ;
Holmes, AL ;
Campbell, JC .
IEEE PHOTONICS TECHNOLOGY LETTERS, 2001, 13 (12) :1346-1348
[14]   Avalanche photodiodes with an impact-ionization-engineered multiplication region [J].
Yuan, P ;
Wang, S ;
Sun, X ;
Zheng, XG ;
Holmes, AL ;
Campbell, JC .
IEEE PHOTONICS TECHNOLOGY LETTERS, 2000, 12 (10) :1370-1372
[15]   A new look at impact ionization - Part II: Gain and noise in short avalanche photodiodes [J].
Yuan, P ;
Anselm, KA ;
Hu, C ;
Nie, H ;
Lenox, C ;
Holmes, AL ;
Streetman, BC ;
Campbell, JC ;
McIntyre, RJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1999, 46 (08) :1632-1639
[16]   Impact ionization characteristics of III-V semiconductors for a wide range of multiplication region thicknesses [J].
Yuan, P ;
Hansing, CC ;
Anselm, KA ;
Lenox, CV ;
Nie, H ;
Holmes, AL ;
Streetman, BC ;
Campbell, JC .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 2000, 36 (02) :198-204
[17]   Multiplication noise of AlxGa1-xAs avalanche photodiodes with high Al concentration and thin multiplication region [J].
Zheng, XG ;
Sun, X ;
Wang, S ;
Kinsey, GS ;
Holmes, AL ;
Streetman, BG ;
Campbell, JC .
APPLIED PHYSICS LETTERS, 2001, 78 (24) :3833-3835