High-Fidelity Transport of Trapped-Ion Qubits through an X-Junction Trap Array

被引：123

作者：

Blakestad, R. B. ^{[1
]}

Ospelkaus, C. ^{[1
]}

VanDevender, A. P. ^{[1
]}

Amini, J. M. ^{[1
]}

Britton, J. ^{[1
]}

Leibfried, D. ^{[1
]}

Wineland, D. J. ^{[1
]}

机构：

[1] Natl Inst Stand & Technol, Boulder, CO 80305 USA

来源：

PHYSICAL REVIEW LETTERS | 2009年 / 102卷 / 15期

关键词：

QUANTUM; STATES; ARCHITECTURE;

D O I：

10.1103/PhysRevLett.102.153002

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We report reliable transport of Be-9(+) ions through an "X junction" in a 2D trap array that includes a separate loading and reservoir zone. During transport the ion's kinetic energy in its local well increases by only a few motional quanta and internal-state coherences are preserved. We also examine two sources of energy gain during transport: a particular radio-frequency noise heating mechanism and digital sampling noise. Such studies are important to achieve scaling in a trapped-ion quantum information processor.

引用

页数：4

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