Annealing effect of surface magnetic properties in amorphous Co1-xTix thin films

被引:4
作者
Kim, YY
Baek, JS
Lee, SJ
Lim, WY
Yu, SC
Lee, SH
机构
[1] CHUNGBUK NATL UNIV,DEPT PHYS,CHONJU 360763,SOUTH KOREA
[2] CHONGJU UNIV,DEPT PHYS,CHEONGJU 360764,SOUTH KOREA
关键词
D O I
10.1109/20.619512
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
For amorphous Co1-xTix(X=0.13, 0.16, 0.21 at.%) thin films deposited by DC magnetron sputtering method ferromagnetic resonance experiments have been used to investigate the dependence of surface magnetic properties in according to annealing temperatures(150 similar to 225 degrees C). Spin wave resonance spectra for all annealing temperatures consist of several volume modes and one(or two) surface mode. It is suggested that both surfaces of the film have a perpendicular hard axis to the film plane(negative surface anisotropy). Also, the surface anisotropy K-s2 at substrate-film interface is varied slowly from -0.11 to -0.25 erg/cm(2) and the surface anisotropy K-s1 at film-air interface is varied from 0.16 to -0.53 erg/cm(2) with increasing annealing temperatures. We conjecture that the variation of surface anisotropy K-s1 is due to the increase of Co concentration resulted from Ti oxidation for low temperature annealing(150 similar to 200 degrees C) and the diffusion of Co atoms near the film surfaces for high temperature annealing(225 similar to 250 degrees C).
引用
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页码:3607 / 3609
页数:3
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