XPEEM with energy-filtering: Advantages and first results from the smart project

被引：78

作者：

Schmidt, T

Groh, U

Fink, R

Umbach, E

机构：

[1] Univ Wurzburg, D-97074 Wurzburg, Germany

[2] Max Planck Gesell, Fritz Haber Inst, D-14195 Berlin, Germany

[3] Angew Phys, D-64289 Darmstadt, Germany

[4] Tech Univ Clausthal, Inst Phys, D-38678 Clausthal Zellerfeld, Germany

[5] LEO Elektronenmikroskopie GMBH, D-73446 Oberkochen, Germany

[6] Arizona State Univ, Dept Phys & Astron, Tempe, AZ 85287 USA

来源：

SURFACE REVIEW AND LETTERS | 2002年 / 9卷 / 01期

关键词：

D O I：

10.1142/S0218625X02001811

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The second development step of the SMART project, i.e. an energy-filtered but not yet corrected photoelectron emission microscope, operates at the undulator U49/1-PGM beamline at BESSY II. It already demonstrates the variety of methods of the final version: microscopy, spectroscopy and electron diffraction. Some recent experimental results are reported for these three operation modes. In addition, the theoretical improvement of lateral resolution and transmission of PEEMs in general by using an energy filter is discussed for systems without and with aberration correction.

引用

页码：223 / 232

页数：10

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