Selective growth of GaAs quantum dots on the triangle nanocavities bounded by SiO2 mask on Si substrate by MBE

被引:12
作者
Zheng, YB
Chua, SJ
Huan, CHA
Miao, ZL
机构
[1] Natl Univ Singapore, Dept Elect & Comp Engn, Ctr Optoelect, Singapore 117576, Singapore
[2] Natl Univ Singapore, Dept Phys, Surface Sci Lab, Singapore 117542, Singapore
[3] Inst Mat Res & Engn, Singapore 117602, Singapore
关键词
atomic force microscopy; molecular beam epitaxy; quantum dots; semiconducting III-V materials;
D O I
10.1016/j.jcrysgro.2004.04.056
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Selective molecular-beam epitaxy (MBE) growth of GaAs quantum dots (QDs) on the uniform and periodic arrays of triangle nanocavities bounded by SiO2 mask on Si substrate has been realized. These triangle nanocavities with vertical sidewalls, known as windows, are obtained on Si substrate with thin layer SiO2 on the surface by combining inductively coupled plasma etching and nanosphere lithography. MBE growth conditions are optimized to achieve a vanishingly small sticking coefficient of incident Ga atoms on the SiO2 surface and a near unity sticking coefficient on the open triangle Si substrate surface, achieving selective growth of GaAs QDs on these triangle nanocavities. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:369 / 374
页数:6
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